相关论文: Application of elastic mid-IR light scattering for…
A method of low-angle mid-IR light scattering is shown to be applicable for the contactless and non-destructive inspection of the internal gettering process in CZ Si crystals. A classifcation of scattering inhomogeneities in initial…
Some possible applications of the low-angle mid-IR-light scattering technique and some recently developed on its basis methods for non-destructive inspection and investigation of semiconductor materials and structures are discussed in the…
A method of the mid-IR-laser microscopy has been proposed for the investigation of the large-scale electrically and recombination active defects in semiconductors and non-destructive inspection of semiconductor materials and structures in…
A non-destructive optical technique described in this paper is an effective new tool for the investigation of defects in semiconductors. The basic instrument for this technique---a mid-IR-laser microscope---being sensitive to accumulations…
This paper presents a new technique of optical beam-induced scattering of mid-IR-laser radiation, which is a special mode of the recently developed scanning mid-IR-laser microscopy. The technique in its present form is designed for…
A method of scanning mid-IR-laser microscopy has recently been proposed for the investigation of large-scale electrically and recombination-active defects in semiconductors and non-destructive inspection of semiconductor materials and…
The scanning mid-IR-laser microscopy was previously demonstrated as an effective tool for characterization of different semiconductor crystals. Now the technique has been successfully applied for the investigation of CZ SixGe1-x -- a…
The scanning mid-IR-laser microscopy was previously demonstrated as an effective tool for characterization of different semiconductor crystals. Now the technique has been successfully applied for the investigation of CZ Si$_x$Ge$_{1-x}$---a…
We describe a self calibrating optical technique that allows to perform absolute measurements of scattering cross sections for the light scattered at extremely small angles. Very good performances are obtained by using a very simple optical…
Czochralski-grown silicon crystals were studied by the techniques of the low-angle mid-IR-light scattering and electron-beam-induced current. The large-scale accumulations of electrically-active impurities detected in this material were…
This contribution highlights some topics addressed by current and future experiments in Semi-Inclusive Deep-Inelastic Scattering. We concentrate on the programs at 12 and 22 GeV at Jefferson Lab using the CLAS detector, and at the future…
We describe an experiment, located in south-east Colorado, USA, that measured aerosol optical depth profiles using two Lidar techniques. Two independent detectors measured scattered light from a vertical UV laser beam. One detector, located…
Laser Light Scattering (LLS) method, combined with a long-distance microscope was utilized to detect micrometer-sized particles on a smooth substrate. LLS was capable to detect individual particle release, shrink, or fragmentation during…
Dynamic light scattering techniques are routinely used for numerous industrial and research applications, because they can give access to the motion spectrum of micro- and nano-objects, and therefore to particle sizes or visco-elastic…
The results obtained using my computing program are consistent with the values obtained twenty years ago. It also makes me believe that how to obtain particle size information using the Light Scattering technique needs to be reconsidered.…
The semi-inclusive deep inelastic scattering (SIDIS) process is considered. A theoretical procedure is proposed allowing the direct extraction from the SIDIS data of the first moments of the polarized valence distributions and of the first…
In the scientific literature little attention has been given to the use of dynamic light scattering (DLS) as a tool for extracting the thermodynamic information contained in the absolute intensity of light scattered by gels. In this article…
In this work, the particle size distribution measured using the dynamic light scattering (DLS) technique is compared with that obtained from the static light scattering (SLS) technique or provided by the supplier measured using the…
The elastic scattering process $\Lambda p\to\Lambda p$ offers insights on multiple problems in nuclear physics. $\mathrm{SU}(3)_F$ symmetry implies a close agreement between the $\Lambda p$ and $pp$ scattering cross sections. The $\Lambda…
Laser-assisted electron scattering (LAES), a light-matter interaction process that facilitates energy transfer between strong light fields and free electrons, has so far been observed only in gas phase. Here we report on the observation of…