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相关论文: Reliably Counting Atomic Planes of Few-Layer Graph…

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Transport measurements on few layer graphene (FLG) are important as they interpolate between the properties of single layer graphene (SLG) as a true 2-dimensional material and the 3-dimensional bulk properties of graphite. In this article…

介观与纳米尺度物理 · 物理学 2015-03-17 T. Maassen , F. K. Dejene , M. H. D. Guimarães , C. Józsa , B. J. van Wees

Results of room temperature Raman scattering studies of ultrathin graphitic films supported on Si (111)/SiO2 substrates are reported. The results are significantly different from those known for graphite. Spectra were collected using 514 nm…

介观与纳米尺度物理 · 物理学 2015-06-25 Awnish Gupta , Gugang Chen , P. Joshi , S. Tadigadapa , P. C. Eklund

The in-plane shear modes between neighbor-layers of 2-4 layer graphenes (LGs) and the corresponding graphene scrolls rolled up by 2-4LGs were investigated by Raman scattering. In contrast to that just one shear mode was observed in 3-4LGs,…

材料科学 · 物理学 2014-06-11 Ping-Heng Tan , Jiang-Bin Wu , Wen-Peng Han , Wei-Jie Zhao , Xin Zhang , Hui Wang , Yu-Fang Wang

Graphene has many unique properties that make it an ideal material for fundamental studies as well as for potential applications. Here we review the recent results on the Raman spectroscopy and imaging of graphene. Raman spectroscopy and…

材料科学 · 物理学 2008-10-17 Zhen hua Ni , Ying ying Wang , Ting Yu , Ze xiang Shen

We demonstrate the possibility in quantifying the Raman intensities for both specimen and substrate layers in a common stacked experimental configuration and, consequently, propose a general and rapid thickness identification technique for…

介观与纳米尺度物理 · 物理学 2013-08-20 Song-Lin Li , Hisao Miyazaki , Haisheng Song , Hiromi Kuramochi , Shu Nakaharai , Kazuhito Tsukagoshi

Raman spectroscopy of graphene is reviewed from a theoretical perspective. After an introduction of the building blocks (electronic band structure, phonon dispersion, electron-phonon interaction, electron-light coupling), Raman intensities…

介观与纳米尺度物理 · 物理学 2017-03-23 Sven Reichardt , Ludger Wirtz

A simple, non-invasive method using Raman spectroscopy for the estimation of the thickness of graphene layers grown epitaxially on silicon carbide (SiC) is presented, enabling simultaneous determination of thickness, grain size and disorder…

Avoiding charge density variations and impurities in graphene is vital for high-quality graphene-based devices. Here, we demonstrate an optical method using Raman 2D peak-split to monitor charge density variations in the range 1-25e10 cm-2.…

应用物理 · 物理学 2020-05-12 Zhuofa Chen , Nathan Ullberg , Mounika Vutukuru , David Barton , Anna K Swan

Raman spectroscopy has become an essential technique to characterize and investigate graphene and many other two-dimensional materials. However, there still lacks consensus on the Raman signature and phonon dispersion of atomically thin…

The Raman shift, broadening, and relative Raman intensities of bilayer graphene are computed as functions of the electron concentration. We include dynamic effects for the phonon frequencies and we consider the gap induced in the band…

材料科学 · 物理学 2009-09-11 Paola Gava , Michele Lazzeri , A. Marco Saitta , Francesco Mauri

Graphene has attracted great attentions since its first discovery in 2004. Various approaches have been proposed to control its physical and electronic properties. Here, we report that graphene based intercalation compounds is an efficient…

材料科学 · 物理学 2010-11-04 Da Zhan , Li Sun , Zhenhua Ni , Lei Liu , Xiaofeng Fan , Yingying Wang , Ting Yu , Yeng Ming Lam , Wei Huang , Zexiang Shen

Few-layer graphene (FLG) has been predicted to exist in various crystallographic stacking sequences, which can strongly influence the electronic properties of FLG. We demonstrate an accurate and efficient method to characterize stacking…

材料科学 · 物理学 2011-02-01 Chun Hung Lui , Zhiqiang Li , Zheyuan Chen , Paul V. Klimov , Louis E. Brus , Tony F. Heinz

Raman spectroscopy is one of the widely used methods in the analysis of various samples including carbon-based materials. This study aimed to identify the number of layers and defects in graphene using micro-Raman spectroscopy. More…

光学 · 物理学 2024-03-21 Somayeh Gholipour , Maryam Bahreini , Mohamad Reza Jafarfard

Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic…

We experimentally investigated the properties of graphite layers produced by an easy and non-conventional method of repeatedly rubbing conventional random stacked graphite bulk against insulating and semiconductor substrates. The patterned…

材料科学 · 物理学 2014-02-18 A. R. Mailian , G. Sh. Shmavonyan , M. R. Mailian

An efficient route to synthesize macroscopic amounts of graphene is highly desired and a bulk characterization of such samples, in terms of the number of layers, is equally important. We present a Raman spectroscopy-based method to…

Using a scanning electron microscope, we observed a reproducible, discrete distribution of secondary electron intensity stemming from an atomically thick graphene film on a thick insulating substrate. The discrete distribution made it…

材料科学 · 物理学 2010-09-29 Hidefumi Hiura , Hisao Miyazaki , Kazuhito Tsukagoshi

We present a detailed calculation of intensities of two-phonon and four-phonon Raman peaks in graphene. Writing the low-energy hamiltonian of the interaction of electrons with the crystal vibrations and the electromagnetic field from pure…

材料科学 · 物理学 2009-11-13 D. M. Basko

We report the frictional response of few-layer graphene (FLG) flakes obtained by liquid phase exfoliation (LPE) of pristine graphite. To this end, we inkjet print FLG on bare and hexamethyldisilazane-terminated SiO2 substrates, producing…

We report the observation of layer breathing mode (LBM) vibrations in few-layer graphene (FLG) samples of thickness from 2 to 6 layers, exhibiting both Bernal (AB) and rhombohedral (ABC) stacking order. The LBM vibrations are identified…

介观与纳米尺度物理 · 物理学 2012-11-15 Chun Hung Lui , Leandro M. Malard , SukHyun Kim , Gabriel Lantz , François E. Laverge , Riichiro Saito , Tony F. Heinz