相关论文: Carbon fibre tips for scanning probe microscopy ba…

The invention of scanning probe microscopy has revolutionized the way electronic phenomena are visualized. While present-day probes can access a variety of electronic properties at a single location in space, a scanning microscope that can…

Carbon nanotubes (CNTs) are well known for their exceptional thermal, mechanical and electrical properties. For many CNT applications it is of the foremost importance to know their frictional properties. However, very little is known about…

This paper reports on the excitation of surface plasmons on gold-coated nanofibre tips by side-illumination with a laser beam and the coupling of the surface plasmons to the optical fiber. The measurements show a strong dependence of the…

We demonstrate the fabrication of an optical nanofiber tip (ONFT) using a two-step chemical etching technique. This technique employs 30% and 24% hydrofluoric (HF) acid for the first and second steps, respectively. In the first step, a…

Piezoresponse Force Microscopy is a powerful but delicate nanoscale technique that measures the mechanical response resulting from the application of a highly localized electric field. Though mechanical response is normally due to…

Data transmission at the upgraded Large Hadron Collider experiments, foreseen for mid 2020s will be in the multi Gbit/s range per connection for the innermost detector layers. This paper reports on first tests on the possible use of carbon…

By scanning a fine open-ended coaxial probe above an operating microwave device, we image local electric fields generated by the device at microwave frequencies. The probe is sensitive to the electric flux normal to the face of its center…

Fibres of ultralong and aligned carbon nanotubes (CNT) have axial properties above reference engineering materials, proving to be exceptional materials for application in structural composites, energy storage and other devices. For CNT…

The frictional properties of individual carbon nanotubes (CNTs) are studied by sliding an atomic force microscopy tip across and along its principle axis. This direction-dependent frictional behavior is found to correlate strongly with the…

Vortices play a crucial role in determining the properties of superconductors as well as their applications. Therefore, characterization and manipulation of vortices, especially at the single vortex level, is of great importance. Among many…

We present an alternative switching-magnetization magnetic force microscopy (SM- MFM) method using planar tip-on-chip probes. Unlike traditional needle-like tips, the planar probe approach integrates a microdevice near the tip apex with…

This book chapter reviews progress in crystallographic image processing (CIP) for scanning probe microscopy (SPM) that has occurred since our description of the technique was first put into open access in this book series in the year 2010.…

Epoxy nanocomposites able to meet pressing industrial requirements in the field of structural material have been developed and characterized. Tunneling Atomic Force Microscopy (TUNA), which is able to detect ultra-low currents ranging from…

The local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work function and tip-sample forces.…

Single-atom quantum sensors offer high spatial resolution and high sensitivity to electric and magnetic fields. Among them, trapped ions offer exceptional performance in sensing electric fields, which has been used in particular to probe…

We demonstrate the fabrication of scanning superconducting quantum interference devices (SQUIDs) on the apex of sharp quartz scanning probes -- known as SQUID-on-tip probes -- using conventional magnetron sputtering. We produce and…

We demonstrate a photonic radio frequency (RF) transversal filter based on an integrated optical micro-comb source featuring a record low free spectral range of 49 GHz yielding 80 micro-comb lines across the C-band. This record-high number…

We consider conductance mapping of systems based on the two-dimensional electron gas with scanning gate microscopy using two and more tips of the atomic force microscope. The paper contains results of numerical simulations for a model tip…

A major challenge in Atomic Force Microscopy (AFM) is to reduce the scan duration while retaining the image quality. Conventionally, the scan rate is restricted to a sufficiently small value in order to ensure a desirable image quality as…

The exceptional interest in improving the limitations of data storage, molecular electronics, and optoelectronics has promoted the development of an ever increasing number of techniques used to pattern polymers at micro and nanoscale. Most…