相关论文: Carbon fibre tips for scanning probe microscopy ba…

Force perception on medical instruments is critical for understanding the mechanism between surgical tools and tissues for feeding back quantized force information, which is essential for guidance and supervision in robotic autonomous…

Modern extreme adaptive optics (AO) systems achieving diffraction-limited performance open up new possibilities for instrumentation. Especially important for the fields of spectroscopy and interferometry is that it enables the prospect to…

Recently, the family of high-resolution scanning probe imaging techniques using decorated tips has been complimented by a method based on inelastic electron tunneling spectroscopy (IETS). The new technique resolves the inner structure of…

Multi-tip scanning tunneling microscopy (STM) is a powerful method to perform charge transport measurements at the nanoscale. With four STM tips positioned on the surface of a sample, four-point resistance measurements can be performed in…

We demonstrate the fabrication of sharp nanopillars of high aspect ratio onto specialized atomic force microscopy (AFM) microcantilevers and their use for high-speed AFM of DNA and nucleoproteins in liquid. The fabrication technique uses…

A Scanning Tunneling Microscope (STM) is one of the most important scanning probe tools available to study and manipulate matter at the nanoscale. In a STM, a tip is scanned on top of a surface with a separation of a few \AA. Often, the…

We present the design and measured performance of a new carbon fiber strut design that is used in a cryogenically cooled truss for the Simons Observatory Small Aperture Telescope (SAT). The truss consists of two aluminum 6061 rings…

Bio-chemical reactions enable the production of biomimetic materials such as sandstones. In the present study, microbiologically-induced calcium carbonate precipitation (MICP) is used to manufacture laboratory-scale specimens for fracture…

Tactile sensing holds great promise for enhancing manipulation precision and versatility, but its adoption in robotic hands remains limited due to high sensor costs, manufacturing and integration challenges, and difficulties in extracting…

Patterning graphene into various mesoscopic devices such as nanoribbons, quantum dots, etc. by lithographic techniques has enabled the guiding and manipulation of graphene's Dirac-type charge carriers. Graphene, with well-defined strain…

Friction force microscopy (FFM) with silicon tips on epitaxial graphene supported by SiC(0001) previously revealed a sharp increase in friction at a threshold normal force, linked to the intermittent rehybridization of graphene and the…

Using exact three-dimensional vectorial simulations of radiation coupling into uncoated dielectric fiber probes, we calculate amplitude transfer functions for conical single-mode fiber tips at the light wavelength of 633 nm. The coupling…

The COMPASS force field has been successfully applied in a large number of materials simulations, including the analysis of structural, electrical, thermal, and mechanical properties of carbon nanoparticles. This force field has been…

We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band…

The separation of physical forces acting on the tip of a magnetic force microscope (MFM) is essential for correct magnetic imaging. Electrostatic forces can be modulated by varying the tip-sample potential and minimized to map the local…

A simple model is introduced to describe conductance measurements between a scanning tunneling microscope (STM) tip and a noble metal surface with adsorbed transition metal atoms which display the Kondo effect. The model assumes a realistic…

Thin shell carbon fiber composites have great potential for structures that require large recoverable deformations, high stiffness and low weight, as in deployable space structures, biomedical devices and robotics. Despite being…

The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen…

Scanning Probe Microscopy allows for extreme resolution down to the atomic scale. Unfortunately, total scanning range is rather limited, therefore finding a specific position on the sample is tedious. This is an important limitation of many…

A carbon nanotube (CNT) tip was fabricated at the apex of an etched tungsten wire by chemical vapor deposition and used for scanning tunneling microscopy. The honeycomb lattice of graphite in the STM images was resolved with a CNT tip at…