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The evolution of the scanning modules for scanning transmission electron microscopes (STEM) has realized the possibility to generate arbitrary scan pathways, an approach currently explored to improve acquisition speed and to reduce electron…

The use of electron mirrors in aberration correction and surface-sensitive microscopy techniques such as low-energy electron microscopy has been established. However, in this work, by implementing an easy to construct, fully electrostatic…

We report device level damping measurements using spin-torque driven ferromagnetic resonance on perpendicular magnetic random-access memory (MRAM) cells. It is shown that thermal agitation enhances the apparent damping for cells smaller…

介观与纳米尺度物理 · 物理学 2024-07-31 H. J. Richter , G. Mihajlović , R. V. Chopdekar , W. Jung , J. Gibbons , N. D. Melendez , M. K. Grobis , T. S. Santos

The scanning electron microscope (SEM) recordings of dynamic nano-electromechanical systems (NEMS) are difficult to analyze due to the noise caused by low frame rate, insufficient resolution and blurriness induced by applied electric…

图像与视频处理 · 电气工程与系统科学 2023-07-19 Ege Erdem , Berke Demiralp , Hadi S Pisheh , Peyman Firoozy , Ahmet Hakan Karakurt , M. Selim Hanay

Electrochemistry is the underlying mechanism in a variety of energy conversion and storage systems, and it is well known that the composition, structure, and properties of electrochemical materials near active interfaces often deviates…

材料科学 · 物理学 2018-02-07 Ahmad Eshghinejad , Ehsan Nasr Esfahani , Chihou Lei , Jiangyu Li

Nanoscale optoelectronic components achieve functionality via spatial variation in electronic structure induced by composition, defects, and dopants. To dynamically change the local band alignment and influence defect states, a scanning…

应用物理 · 物理学 2025-02-20 Yen-Po Liu , Jonatan Fast , Yang Chen , Ren Zhe , Adam Burke , Rainer Timm , Heiner Linke , Anders Mikkelsen

Although in-situ transmission electron microscopy (TEM) of nanomaterials has been gaining importance in recent years, difficulties in sample preparation have limited the number of studies on electrical properties. Here, a support-based…

介观与纳米尺度物理 · 物理学 2024-03-14 Simon Hettler , Mohammad Furqan , Raul Arenal

Scanning Transmission Electron Microscopy (STEM) is a critical tool for imaging the properties of materials and biological specimens at atomic scale, yet our understanding of relevant electron beam damage mechanisms is incomplete. Recent…

信号处理 · 电气工程与系统科学 2025-07-02 Amir Javadi Rad , Amirafshar Moshtaghpour , Dongdong Chen , Angus I. Kirkland

Moir\'e fringes are used throughout a wide variety of applications in physics and engineering to bring out small variations in an underlying lattice by comparing with another reference lattice. This method was recently demonstrated in…

应用物理 · 物理学 2020-02-06 Viveksharma Prabhakara , Daen Jannis , Armand Béché , Hugo Bender , Johan Verbeeck

Over the last two decades, Electron Energy Loss Spectroscopy (EELS) imaging with a scanning transmission electron microscope (STEM) has emerged as a technique of choice for visualizing complex chemical, electronic, plasmonic, and phononic…

Outlined here is a technique for sub-wavelength infrared surface imaging performed using a phase matched optical parametric oscillator laser and an atomic force microscope as the detection mechanism. The technique uses a novel surface…

Incommensurate heterostructures of two-dimensional (2D) materials, despite their attractive electronic behaviour, are challenging to simulate because of the absence of translation symmetry. Experimental investigations of these structures…

Microscopy has been key to tremendous advances in science, technology, and medicine, revealing structure and dynamics across time and length scales. However, combining high spatial and temporal resolution in a non-invasive, label-free…

Using scanning gate microscopy (SGM), we probe the scattering between a beam of electrons and a two-dimensional electron gas (2DEG) as a function of the beam's injection energy, and distance from the injection point. At low injection…

介观与纳米尺度物理 · 物理学 2010-11-02 M. P. Jura , M. Grobis , M. A. Topinka , L. N. Pfeiffer , K. W. West , D. Goldhaber-Gordon

Elastic waves propagating in piezoelectric materials are accompanied by a time-varying electric potential, which is of critical importance for acousto-electronic applications. The spatial mapping of such a potential at microwave frequencies…

介观与纳米尺度物理 · 物理学 2018-06-25 Lu Zheng , Di Wu , Xiaoyu Wu , Keji Lai

After evaporation of the organic solvents, benzene, toluene, and cyclohexane on gold substrates, Scanning Tunneling Microscope (STM) shows the presence of a remaining adsorbed layer. The different solvent molecules were individually…

We present a theoretical analysis of the standing wave patterns in STM images, which occur around surface point defects. We consider arbitrary dispersion relations for the surface states and calculate the conductance for a system containing…

介观与纳米尺度物理 · 物理学 2014-01-16 N. V. Khotkevych-Sanina , Yu. A. Kolesnichenko , J. M. van Ruitenbeek

We investigate the temperature distributions of Joule self-heated graphene nanoribbons (GNRs) with a spatial resolution finer than 100 nm by scanning thermal microscopy (SThM). The SThM probe is calibrated using the Raman G mode…

The scanning electron microscope (SEM) produces an image of a sample by scanning it with a focused beam of electrons. The electrons interact with the atoms in the sample, which emit secondary electrons that contain information about the…

计算机视觉与模式识别 · 计算机科学 2017-09-08 Shahar Tsiper , Or Dicker , Idan Kaizerman , Zeev Zohar , Mordechai Segev , Yonina C. Eldar

Despite decades of research, the ultimate goal of nanotechnology--top-down manipulation of individual atoms--has been directly achieved with only one technique: scanning probe microscopy. In this Review, we demonstrate that scanning…