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Power device reliability is a major concern during operation under extreme environments, as doing so reduces the operational lifetime of any power system or sensing infrastructure. Due to a potential for system failure, devices must be…

机器学习 · 计算机科学 2021-07-23 Carlos Olivares , Raziur Rahman , Christopher Stankus , Jade Hampton , Andrew Zedwick , Moinuddin Ahmed

Our ISCA 2013 paper provides a fundamental empirical understanding of two major factors that make it very difficult to determine the minimum data retention time of a DRAM cell, based on the first comprehensive experimental characterization…

硬件体系结构 · 计算机科学 2023-06-29 Onur Mutlu

We describe verification techniques for embedded memory systems using efficient memory modeling (EMM), without explicitly modeling each memory bit. We extend our previously proposed approach of EMM in Bounded Model Checking (BMC) for a…

计算机科学中的逻辑 · 计算机科学 2011-11-09 Malay K. Ganai , Aarti Gupta , Pranav Ashar

Memory cores are usually the densest portion with the smallest feature size in system-on-chip (SOC) designs. The reliability of memory cores thus has heavy impact on the reliability of SOCs. Transparent test is one of useful technique for…

硬件体系结构 · 计算机科学 2011-11-09 Jin-Fu Li , Tsu-Wei Tseng , Chin-Long Wey

A well-known approach for identifying defect-prone parts of software in order to focus testing is to use different kinds of product metrics such as size or complexity. Although this approach has been evaluated in many contexts, the question…

软件工程 · 计算机科学 2014-02-05 Frank Elberzhager , Stephan Kremer , Jürgen Münch , Danilo Assmann

Induction motors are one of the most crucial electrical equipment and are extensively used in industries in a wide range of applications. This paper presents a machine learning model for the fault detection and classification of induction…

机器学习 · 计算机科学 2024-09-17 Kavana Venkatesh , Neethi M

Thermomechanical stress induced by through-silicon vias (TSVs) plays an important role in the performance and reliability analysis of 2.5D/3D ICs. While the finite element method (FEM) adopted by commercial software can provide accurate…

计算工程、金融与科学 · 计算机科学 2024-11-20 Tianxiang Zhu , Qipan Wang , Yibo Lin , Runsheng Wang , Ru Huang

We survey the current state of phase change memory (PCM), a non-volatile solid-state memory technology built around the large electrical contrast between the highly-resistive amorphous and highly-conductive crystalline states in so-called…

Process simulation are performed in order to simulate the full fabrication process of an alternative nano-flash memory in order to optimise it and to improve the understanding of the dot storage formation. The influence of various…

To fully learn the latent temporal dependencies from post-disturbance system dynamic trajectories, deep learning is utilized for short-term voltage stability (STVS) assessment of power systems in this paper. First of all, a semi-supervised…

信号处理 · 电气工程与系统科学 2021-02-25 Meng Zhang , Jiazheng Li , Yang Li , Runnan Xu

Processor design validation and debug is a difficult and complex task, which consumes the lion's share of the design process. Design bugs that affect processor performance rather than its functionality are especially difficult to catch,…

硬件体系结构 · 计算机科学 2020-11-20 Erick Carvajal Barboza , Sara Jacob , Mahesh Ketkar , Michael Kishinevsky , Paul Gratz , Jiang Hu

Embedded systems are ubiquitous and play critical roles in management systems for industry and transport. Software failures in these domains may lead to loss of production or even loss of life, so the software in these systems needs to be…

软件工程 · 计算机科学 2021-11-17 Per Erik Strandberg

The software is often produced under significant time constraints. Our idea is to understand the effects of various software development practices on the performance of developers working in stressful environments, and identify the best…

The distribution of data changes over time; models operating in dynamic environments need retraining. But knowing when to retrain, without access to labels, is an open challenge since some, but not all shifts degrade model performance. This…

机器学习 · 计算机科学 2025-11-05 Viet Nguyen , Changjian Shui , Vijay Giri , Siddharth Arya , Amol Verma , Fahad Razak , Rahul G. Krishnan

To face future reliability challenges, it is necessary to quantify the risk of error in any part of a computing system. To this goal, the Architectural Vulnerability Factor (AVF) has long been used for chips. However, this metric is used…

硬件体系结构 · 计算机科学 2023-08-02 Luc Jaulmes , Miquel Moretó , Mateo Valero , Marc Casas

This paper reports a reduced-order modeling framework of bladed disks on a rotating shaft to simulate the vibration signature of faults like cracks in different components aiming towards simulated data-driven machine learning. We have…

计算工程、金融与科学 · 计算机科学 2022-08-24 Divya Shyam Singh , Atul Agrawal , D. Roy Mahapatra

Complex industrial systems are continuously monitored by a large number of heterogeneous sensors. The diversity of their operating conditions and the possible fault types make it impossible to collect enough data for learning all the…

人工智能 · 计算机科学 2019-08-27 Gabriel Michau , Yang Hu , Thomas Palmé , Olga Fink

The aggressive scaling of technology may have helped to meet the growing demand for higher memory capacity and density, but has also made DRAM cells more prone to errors. Such a reality triggered a lot of interest in modeling DRAM behavior…

分布式、并行与集群计算 · 计算机科学 2020-03-30 Lev Mukhanov , Konstantinos Tovletoglou , Hans Vandierendonck , Dimitrios S. Nikolopoulos , Georgios Karakonstantis

Memory consistency models (MCMs) which govern inter-module interactions in a shared memory system, are a significant, yet often under-appreciated, aspect of system design. MCMs are defined at the various layers of the hardware-software…

硬件体系结构 · 计算机科学 2017-02-09 Caroline Trippel , Yatin A. Manerkar , Daniel Lustig , Michael Pellauer , Margaret Martonosi

Future digital signal processing (DSP) systems must provide robustness on algorithm and application level to the presence of reliability issues that come along with corresponding implementations in modern semiconductor process technologies.…