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Accelerated degradation tests are used to provide accurate estimation of lifetime characteristics of highly reliable products within a relatively short testing time. Data from particular tests at high levels of stress (e.g., temperature,…
In recent years, more attention has been paid prominently to accelerated degradation testing in order to characterize accurate estimation of reliability properties for systems that are designed to work properly for years of even decades.…
Many modern products exhibit high reliability under normal operating conditions. Conducting life tests under these conditions may result in very few observed failures, insufficient for accurate inferences. Instead, accelerated life tests…
The semiconductor industry is reaching a fascinating confluence in several evolutionary trends that will likely lead to a number of revolutionary changes in the design, implementation, scaling, and the use of computer systems. However,…
In contemporary times, the increasing complexity of the system poses significant challenges to the reliability, trustworthiness, and security of the SACRES. Key issues include the susceptibility to phenomena such as instantaneous voltage…
This article presents a comparison of various implementations of the Lattice Discrete Particle Model (LDPM) for the numerical simulation of concrete and other heterogeneous quasibrittle materials. The comparison involves the use of…
Very deep submicron and nanometer technologies have increased notably integrated circuit (IC) sensitiveness to radiation. Soft errors are currently appearing into ICs working at earth surface. Hardened circuits are currently required in…
Many commercially available memory chips are fabricated worldwide in untrusted facilities. Therefore, a counterfeit memory chip can easily enter into the supply chain in different formats. Deploying these counterfeit memory chips into an…
During the operation of a chemical plant, product quality must be consistently maintained, and the production of off-specification products should be minimized. Accordingly, process variables related to the product quality, such as the…
Improvements in main memory storage density are primarily driven by process technology scaling, which negatively impacts reliability by exacerbating various circuit-level error mechanisms. To compensate for growing error rates, both memory…
Reliability has emerged as a key topic of interest for researchers around the world to detect and/or mitigate the side effects of decreasing transistor sizes, such as soft errors. Traditional solutions, like DMR and TMR, incur significant…
Memory consistency models (MCMs) are at the heart of concurrent programming. They represent the behaviour of concurrent programs at the chip level. To test these models small program snippets called litmus test are generated, which show…
In this paper we show how a deep-submicron FPGA can be modified to operate at extremely low temperatures through modifications in the supporting hardware and in the firmware programming it. Though FPGAs are not designed to operate at a few…
The rapid incursion of new technologies such as MEMS and smart sensor device manufacturing requires new tailor-made packaging designs. In many applications these devices are exposed to humid environments. Since the penetration of moisture…
The existence of noisy labels in real-world data negatively impacts the performance of deep learning models. Although much research effort has been devoted to improving robustness to noisy labels in classification tasks, the problem of…
Scalable persistent memory (PM) has opened up new opportunities for building indexes that operate and persist data directly on the memory bus, potentially enabling instant recovery, low latency and high throughput. When real PM hardware…
Large language models (LLMs) can generate programs that pass unit tests, but passing tests does not guarantee reliable runtime behavior. We find that different correct solutions to the same task can show very different memory and…
An Android-based smart Television (TV) must reliably run its applications in an embedded program environment under diverse hardware resource conditions. Owing to the diverse hardware components used to build numerous TV models, TV…
Non-Volatile Memory (NVM) cells are used in neuromorphic hardware to store model parameters, which are programmed as resistance states. NVMs suffer from the read disturb issue, where the programmed resistance state drifts upon repeated…
DRAM-based main memory and its associated components increasingly account for a significant portion of application performance bottlenecks and power budget demands inside the computing ecosystem. To alleviate the problems of storage density…