高折射率掺杂二氧化硅芯片波导中布里渊散射的观测
光学
2023-05-22 v1
摘要
我们报道了在一条 50 厘米长的螺旋高折射率掺杂二氧化硅芯片波导中观测到布里渊背向散射，并测得其布里渊频移为 16 GHz，该结果与基于弹性动力学方程的理论预测和数值模拟非常吻合。
引用
@article{arxiv.2305.11502,
title = {Observation of Brillouin scattering in a high-index doped silica chip waveguide},
author = {M. Zerbib and V. T. Hoang and J. C. Beugnot and K. P. Huy and B. Little and S. T. Chu and D. J. Moss and R. Morandotti and B. Wetzel and T. Sylvestre},
journal= {arXiv preprint arXiv:2305.11502},
year = {2023}
}
备注
5 pages, 6 figures