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Instance-Optimal Quantum State Certification with Entangled Measurements

量子物理 2025-07-09 v1 数据结构与算法 机器学习

摘要

We consider the task of quantum state certification: given a description of a hypothesis state σ\sigma and multiple copies of an unknown state ρ\rho, a tester aims to determine whether the two states are equal or ϵ\epsilon-far in trace distance. It is known that Θ(d/ϵ2)\Theta(d/\epsilon^2) copies of ρ\rho are necessary and sufficient for this task, assuming the tester can make entangled measurements over all copies [CHW07,OW15,BOW19]. However, these bounds are for a worst-case σ\sigma, and it is not known what the optimal copy complexity is for this problem on an instance-by-instance basis. While such instance-optimal bounds have previously been shown for quantum state certification when the tester is limited to measurements unentangled across copies [CLO22,CLHL22], they remained open when testers are unrestricted in the kind of measurements they can perform. We address this open question by proving nearly instance-optimal bounds for quantum state certification when the tester can perform fully entangled measurements. Analogously to the unentangled setting, we show that the optimal copy complexity for certifying σ\sigma is given by the worst-case complexity times the fidelity between σ\sigma and the maximally mixed state. We prove our lower bounds using a novel quantum analogue of the Ingster-Suslina method, which is likely to be of independent interest. This method also allows us to recover the Ω(d/ϵ2)\Omega(d/\epsilon^2) lower bound for mixedness testing [OW15], i.e., certification of the maximally mixed state, with a surprisingly simple proof.

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引用

@article{arxiv.2507.06010,
  title  = {Instance-Optimal Quantum State Certification with Entangled Measurements},
  author = {Ryan O'Donnell and Chirag Wadhwa},
  journal= {arXiv preprint arXiv:2507.06010},
  year   = {2025}
}

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27 pages