Extended x-ray absorption fine-structure fluorescence测量的改进自吸收校正
凝聚态物理
2007-05-23 v1
摘要
以荧光模式收集的扩展 x射线吸收细节(EXAFS)数据容易受到荧光光子在到达探测器前被样品自吸收导致的 apparent 幅度减小的影响。以往的处理方法假设EXAFS对校正项的影响可忽略，且样品处于厚极限。我们提出一种近似精确的处理方法，可适用于任意样品厚度或浓度，并保留校正项中的EXAFS振荡。
引用
@article{arxiv.cond-mat/0306252,
title = {Improved self-absorption correction for fluorescence measurements of extended x-ray absorption fine-structure},
author = {C. H. Booth and F. Bridges},
journal= {arXiv preprint arXiv:cond-mat/0306252},
year = {2007}
}
备注
3 pages, 3 figure (eps), submitted to The 12th International Conference on X-Ray Absorption Fine Structure (XAFS XII)