Exploring properties of the integrating pixels

Piotr Julian Kapusta; Yasuo Arai; Szymon Bugiel; Roma Dasgupta; Sebastian Glab; Marek Idzik; Wojciech Kucewicz; Toshinobu Miyoshi; Michal Turala

Exploring properties of the integrating pixels

Instrumentation and Detectors 2015-07-06 v1 High Energy Physics - Experiment

Authors: Piotr Julian Kapusta , Yasuo Arai , Szymon Bugiel , Roma Dasgupta , Sebastian Glab , Marek Idzik , Wojciech Kucewicz , Toshinobu Miyoshi , Michal Turala

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Abstract

This paper presents some observations and ideas collected during the tests of the SOI sensors, based on the integration type pixels. First, it contains a rough analysis of the Correlated Double Sampling filtering properties with respect to different noise sources and long sampling intervals, which are typical for the pixels under consideration. Second, results of the pixel leakage current measurements in the pix_2012 and DIPIX pixel detector chips are presented.

Cite

@article{arxiv.1507.00866,
  title  = {Exploring properties of the integrating pixels},
  author = {Piotr Julian Kapusta and Yasuo Arai and Szymon Bugiel and Roma Dasgupta and Sebastian Glab and Marek Idzik and Wojciech Kucewicz and Toshinobu Miyoshi and Michal Turala},
  journal= {arXiv preprint arXiv:1507.00866},
  year   = {2015}
}

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