Microscope Mode Secondary Ion Mass Spectrometry Imaging with a Timepix Detector

András Kiss; Julia H. Jungmann; Donald F. Smith; Ron M. A. Heeren

doi:10.1063/1.4772396

Microscope Mode Secondary Ion Mass Spectrometry Imaging with a Timepix Detector

Instrumentation and Detectors 2013-09-05 v1

Authors: András Kiss , Julia H. Jungmann , Donald F. Smith , Ron M. A. Heeren

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Abstract

In-vacuum active pixel detectors enable high sensitivity, highly parallel time- and space-resolved detection of ions from complex surfaces. For the first time, a Timepix detector assembly was combined with a Secondary Ion Mass Spectrometer for microscope mode SIMS imaging. Time resolved images from various benchmark samples demonstrate the imaging capabilities of the detector system. The main advantages of the active pixel detector are the higher signal-to-noise ratio and parallel acquisition of arrival time and position. Microscope mode SIMS imaging of biomolecules is demonstrated from tissue sections with the Timepix detector.

Keywords

optical microscopy and spectroscopy particle detector silicon photomultipliers

Cite

@article{arxiv.1309.0967,
  title  = {Microscope Mode Secondary Ion Mass Spectrometry Imaging with a Timepix Detector},
  author = {András Kiss and Julia H. Jungmann and Donald F. Smith and Ron M. A. Heeren},
  journal= {arXiv preprint arXiv:1309.0967},
  year   = {2013}
}

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