Response to comment "Measurement of mobility in dual-gated MoS2 transistors"

In our previous paper, we reported on switchable monolayer MoS2 transistors with a high on-off ratio and we claim that dielectric screening can be used to increase the mobility of monolayer MoS2. We estimated its mobility using a method previously applied by Lemme et al. to top-gated graphene nanoribbons. We discuss here the comments raised by M. Fuhrer and J. Hone in their post 1301.4288 and give our own estimates of the possible errors in previous mobility measurements and their origins.