相关论文: Noncontact atomic force microscopy simulator with …

Non-contact scanning probe microscopy (SPM) has developed into a powerful technique to image many different properties of samples. The conventional method involves monitoring the amplitude, phase or frequency of a cantilever oscillating at…

Phase-locked loop (PLL), conceived in 1932 by H. Bellescize, has been the basic electronic component in the development of communication technology from the early analog radio receptors to modern digital civil and military facilities.…

Nonlinear analysis of the phase-locked loop (PLL) based circuits is a challenging task, thus in modern engineering literature simplified mathematical models and simulation are widely used for their study. In this work the limitations of…

Plasma simulations are powerful tools for understanding fundamental plasma science phenomena and for process optimization in applications. To ensure their quantitative accuracy, they must be validated against experiments. In this work, such…

Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a…

Charge pump phase-locked loop with phase-frequency detector (CP-PLL) is an electrical circuit, widely used in digital systems for frequency synthesis and synchronization of the clock signals. In this paper a non-linear second-order model of…

We have studied the dynamics of a spin-torque nanooscillator's (STNO) phase locked loop (PLL) generating microwave oscillations in a broad range of frequencies under the effect of direct current and external magnetic field. Bifurcations in…

A spreadsheet algorithm is given for the atomic force microscope that accounts for non-linear behavior in the deflection of the cantilever and in the photo-diode response. In addition, the data analysis algorithm takes into account…

This paper presents results about fabrication and operation of electrostatic actuators in liquids with various permittivities. In the static mode, we provide experimental and theoretical demonstration that the pull-in effect can be shifted…

The dynamic behavior of AFM is studied taking into account the nonlinear interaction forces between probe and sample. The exerted forces on the free end of micro-beam are simulated with the third degree polynomial. The effect of some…

Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials research. AM-AFM can non-destructively observe fragile…

The Transient Fluctuation Theorem is used to calibrate an Atomic Force Microscope by measuring the fluctuations of the work performed by a time dependent force applied between a collo{\"i}dal probe and the surface. From this measure one can…

We perform simulations and experiments on an oscillating atomic force microscope cantilever approaching a surface, where the intermodulation response of the cantilever driven with two pure harmonic tones is investigated. In the simulations,…

Force sensors are at the heart of different technologies such as atomic force microscopy or inertial sensing \cite{RMPforce2003, Rugar2004, YazdiIEEE}. These sensors often rely on the measurement of the displacement amplitude of mechanical…

Synchronous reference frame phase-looked loop (SRF-PLL) techniques are widely used for interfacing and control applications in the power systems and energy conversion at large. Since a PLL system synchronizes its output with an exogenous…

Frequency dependent dynamic behavior in Piezoresponse Force Microscopy (PFM) implemented on a beam-deflection atomic force microscope (AFM) is analyzed using a combination of modeling and experimental measurements. The PFM signal comprises…

A method to precisely calibrate the oscillation amplitude in Dynamic Scanning Force Microscopy is described. It is experimentally shown that a typical electronics used to process the dynamic motion of the cantilever can be adjusted to…

The distance dependence and atomic-scale contrast observed in nominal contact potential difference (CPD) signals recorded by KPFM on surfaces of insulating and semiconducting samples, have stimulated theoretical attempts to explain such…

The presented paper introduces a design for a phase-locked loop (PLL) that is utilized in frequency synthesis and modulation-demodulation within communication systems and in VLSI applications. The CMOS PLL is designed using 180 nm…

Atomic force microscopy is an important tool for characterizing surface acoustic waves, in particular for high frequencies, where the wavelength is too short to be resolved by laser interferometry. A caveat is, that the cantilever…