Dynamic Force Spectroscopy: Looking at the Total Harmonic Distortion
仪器与探测器
2007-05-23 v1
摘要
Tapping mode atomic force microscopy is a standard technique for inspection and analysis at the nanometer scale. The understanding of the non-linear dynamics of the system due to the tip sample interaction is an important prerequisite for a correct interpretation data acquired by dynamic AFM. Here, the system response in tapping-mode atomic force microscope (AFM) simulated numerically. In the computer model the AFM microcantilever is treated as a distributed parameter system. With this multiple-degree-of-freedom (MDOF) approach the the total harmonic distortion in dynamic AFM spectroscopy is simulated.
引用
@article{arxiv.physics/0501061,
title = {Dynamic Force Spectroscopy: Looking at the Total Harmonic Distortion},
author = {Robert W. Stark},
journal= {arXiv preprint arXiv:physics/0501061},
year = {2007}
}
备注
5 pages, 3 figures First International Meeting on Applied Physics (aphys2003), 2003, Badajoz, Spain