Parametric resonance in atomic force microscopy: A new method to study the tip-surface interaction
材料科学
2007-05-23 v1
摘要
We propose a new method to investigate interactions involved in atomic force microscopy (AFM). It is a dynamical method relying on the growth of oscillations via parametric resonance. With this method the second and third derivatives of the tip-surface interaction potential can be measured simultaneously. Because of its threshold behavior parametric resonance AFM leads to sharp contrasts in surface imaging.
引用
@article{arxiv.cond-mat/9712120,
title = {Parametric resonance in atomic force microscopy: A new method to study the tip-surface interaction},
author = {Franz-Josef Elmer},
journal= {arXiv preprint arXiv:cond-mat/9712120},
year = {2007}
}
备注
Written in REVTeX, 4 pages, 4 Postscript figures