English

The Role of Nonlinear Dynamics in Quantitative Atomic Force Microscopy

Mesoscale and Nanoscale Physics 2013-03-12 v1

Abstract

Various methods of force measurement with the Atomic Force Microscope (AFM) are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation, or the frequency mixing of multiple drive tones by the nonlinear tip-surface force, can be used to concentrate the nonlinear motion in a narrow band of frequency near the cantilevers fundamental resonance, where accuracy and sensitivity of force measurement are greatest. Two different methods for reconstructing tip-surface forces from intermodulation spectra are explained. The reconstruction of both conservative and dissipative tip-surface interactions from intermodulation spectra are demonstrated on simulated data.

Keywords

Cite

@article{arxiv.1202.5217,
  title  = {The Role of Nonlinear Dynamics in Quantitative Atomic Force Microscopy},
  author = {Daniel Platz and Daniel Forchheimer and Erik A. Tholén and David B. Haviland},
  journal= {arXiv preprint arXiv:1202.5217},
  year   = {2013}
}

Comments

25 pages (preprint, double space) 7 figures

R2 v1 2026-06-21T20:24:05.371Z