相关论文: Elliptical X-Ray Spot Measurement
Resonant Inelastic X-Ray Scattering (RIXS) is a well-established tool for probing excitations in a wide range of materials. The measured spectra strongly depend on the scattering geometry, via its influence on the polarization of the…
A transmission screen with subwavelength slots is described which can focus electromagnetic radiation to a two-dimensional subwavelength spot. Unlike negative-refractive-index focusing implementations, this "meta-screen" does not suffer…
The breaks and truncations in the luminosity profile of face-on spiral galaxies offer valuable insights in their formation history. The traditional method of deriving the surface photometry profile for face-on galaxies is to use elliptical…
Medical applications of robots are increasingly popular to objectivise and speed up the execution of several types of diagnostic and therapeutic interventions. Particularly important is a class of diagnostic activities that require physical…
The aim of this work is to provide new insights on the dynamics associated to the resonances which arise as a consequence of the coupling of the effect due to the oblateness of the Earth and the Solar Radiation Pressure (SRP) effect for an…
The backscattering of laser radiation by a relativistic electron beam is a widely used method for measuring the spin polarization of electrons. We consider again the properties of the scattering process paying special attention to recoil…
Rayleigh scattering has shown powerful abilities to study electron resonances of nanomaterials regardless of the specific shapes. In analogy to Rayleigh scattering, here we demonstrate that edge optical scattering from two-dimensional (2D)…
Elastic light scattering by low-dimensional semiconductor objects is investigated theoretically. The differential cross section of resonant light scattering on excitons in quantum dots is calculated. The polarization and angular…
Transient X-ray absorption techniques can measure ultrafast dynamics of the elemental edges in a material or multiple layer junction, giving them immense potential for deconvoluting concurrent processes. However, the interpretation of the…
Over the past decade, optical orbital angular momentum (OAM) modes were shown to offer advantages in optical information acquisition. Here, we introduce a new scheme for optical ranging in which depth is estimated through the angular…
POLAR is a novel compact Compton X-ray polarimeter designed to measure the linear polarization of the prompt emission of Gamma Ray Bursts (GRB) and other strong transient sources such as soft gamma repeaters and solar flares in the energy…
We present a novel method to characterize the e+/- phase space at the IP of the SLAC B-factory, that combines single-beam measurements with a detailed mapping of luminous-region observables. Transverse spot sizes are determined in the two…
The present generation of weak lensing surveys will be superseded by surveys run from space with much better sky coverage and high level of signal to noise ratio, such as SNAP. However, removal of any systematics or noise will remain a…
Optical-window birefringence is frequently a major obstacle in experiments measuring changes in the polarization state of light traversing a sample under investigation. It can contribute a signal indistinguishable from that due to the…
A conceptual set-up for measuring the electric field in silicon detectors by electro-optical imaging is proposed. It is based on the Franz-Keldysh effect which describes the electric field dependence of the absorption of light with an…
Microscopic Imaging Ellipsometry is an optical technique that uses an objective and sensing procedure to measure the ellipsometric parameters {\Psi} and {\Delta} in the form of microscopic maps. This technique is well known for being…
In spectroscopic ellipsometry, the optical properties of materials are obtained indirectly by generally assuming dielectric function and optical models. This ellipsometry analysis, which typically requires numerous model parameters, has…
X-ray polarimetry has seen a growing interest in recent years. Improvements in detector technology and focusing X-ray optics now enable sensitive astrophysical X-ray polarization measurements. These measurements will provide new insights…
We calculate the resonant x-ray scattering (RXS) spectra near the Ce $L_{\rm III}$ absorption edge in CeB$_6$, on the basis of a microscopic model that the $4f$ states of Ce are atomic while the $5d$ states form an energy band with a…
In this work recently produced and commercially available glazed ceramic object with metallic lustre decoration was studied by using a spectroscopic ellipsometer with rotating compensator. The thickness and metal content of the surface…