相关论文: Influences of substrate thickness on neutron specu…
The determination of density profiles with knowing the phase information of complex reflection coefficient for neutron specularly reflected from a film, yields unique results. Recently it has been shown that the phase can be determined by…
A method is proposed which allows a complete determination of the complex reflection coefficient for any free unknown real potential (i.e., in the case where there is no effective absorption). In this method the unknown layer mounted on top…
We present total and specular reflectance measurements of various materials that are commonly (and uncommonly) used to provide baffling and/or to minimize the effect of stray light in optical systems. More specifically, we investigate the…
We have made a high resolution study of the specularity of the atomic reflection from an evanescent wave mirror using velocity selective Raman transitions. We have observed a double structure in the velocity distribution after reflection: a…
We predicted and observed for the first time the quasi-specular albedo of cold neutrons at small incidence angles from a powder of nanoparticles. This albedo (reflection) is due to multiple neutron small-angle scattering. The reflection…
A method is presented for modelling the optical properties of a photonic crystal structure mounted on a substrate which is thick enough that the light reflected from the back is incoherent with reflections from the front. Transmission and…
We review the diffuse scattering and the loss coefficient in ultracold neutron reflection from slightly rough surfaces, report a surprising reduction in loss coefficient due to roughness, and discuss the possibility of transition from…
Polytetrafluoroethylene (PTFE) is an excellent diffuse reflector widely used in light collection systems for particle physics experiments. However, the reflectance of PTFE is a function of its thickness. In this work, we investigate this…
In a recent experiment, the out-of-plane surface susceptibility of a single-layer two-dimensional atom crystal in the visible spectrum has been measured. This susceptibility gives a measurable contribution to the reflectivity of…
Decades of work on beam deformation on reflection, and especially on lateral shifts, have spread the idea that a reflected beam is larger than the incident beam. However, when the right conditions are met, a beam reflected by a multilayered…
Neutron reflectometry is a critical tool for investigating the structure of thin films and interfaces. However, the misapplication of the Born approximation to reflection geometry leads some to assume that the minimum thickness that may be…
An uncommon double-ray scenario of light resonant scattering by a periodic metasurface is proposed to provide strong non-specular reflection. The metasurface is constracted as an array of silicon nanodisks placed on thin silica-on-metal…
Specular reflection is known to play an important role in many fields of scattering applications, e.g., in remote sensing, computer graphics, optimization of visual appearance of industrial products. Usually it can be assumed that the…
A versatile X-ray/neutron reflectivity (specular) simulator using LabVIEW(National Instruments Corp.) for structural study of a multi-layer thin film having any combination, including the repetitions, of nano-scale layers of different…
We consider reflection of electromagnetic waves from layered structures with various dielectric and magnetic properties, including metamaterials. Assuming periodic variations in the permittivity, we find that the reflection is in general…
Approximate expressions for X-ray resonant and M\"ossbauer reflectivity in the total external reflection region are developed for the limiting cases of a semiinfinite mirror with a small resonant addition to the total susceptibility and for…
The scattering length density profile for a thin film structure can be determined uniquely if both modulus and phase of the reflection coefficient is known. Here, we describe a method for recovering the phase information which utilize a…
How to make a material anti-reflective without changing its high refraction index? Achieving anti-reflection in high-refractive-index materials poses challenges due to their high reflectivity (Fresnel equations). Based on theory with new…
Frustrated total internal reflection is analyzed from an unusual point of view Unlike most similar works, incident angles are used here as the scanning variable, instead of the tunneled film thickness. The theoretical framework is presented…
In the past decade, several neutron reflectometry methods for determining the modulus and phase of the complex reflection coefficient of an unknown multilayer thin film have been worked out among which the method of variation of…