相关论文: Modeling electric field sensitive scanning probe m…

We have developed a modeling method suitable to analyze single- and multiple-electron resonances detected by electric-field-sensitive scanning probe techniques. The method is based on basic electrostatics and a numerical boundary-element…

Subsurface Charge Accumulation imaging is a cryogenic scanning probe technique that has recently been used to spatially probe incompressible strips formed in a two-dimensional electron system (2DES) at high magnetic fields. In this paper,…

By scanning a fine open-ended coaxial probe above an operating microwave device, we image local electric fields generated by the device at microwave frequencies. The probe is sensitive to the electric flux normal to the face of its center…

Using the tip of a scanning probe microscope as a local electrostatic gate gives access to real space information on electrostatics as well as charge transport at the nanoscale, provided that the tip-induced electrostatic potential is well…

We present a novel method to image spin properties of spintronic systems using the spatially confined field of a scanned micromagnetic probe, in conjunction with existing electrical or optical global spin detection schemes. It is thus…

Electric Scanning Probe Microscopies are used to characterize the surface behavior of ferroelectric materials. The effects of local charge density on the chemistry and physics of ferroelectric surfaces are investigated. The kinetics and…

In this $\ll$ contribution we address the question to what extent surface charges affect contact-mode scanning force microscopy measurements. % We therefore designed samples where we could generate localized electric field distributions…

The resonant buildup of light within optical microcavities elevates the radiation pressure which mediates coupling of optical modes to the mechanical modes of a microcavity. Above a certain threshold pump power, regenerative mechanical…

We demonstrate a simple method to significantly improve the sharpness of standard silicon probes for an atomic force microscope, or to repair a damaged probe. The method is based on creating and maintaining a strong, spatially localized…

A stripline-type near-field microwave probe is microfabricated for microwave impedance microscopy. Unlike the poorly shielded coplanar probe that senses the sample tens of microns away, the stripline structure removes the stray fields from…

Using the electrostatic approximation, we analyze electromagnetic fields scattered by sharp conical metal tips, which are illuminated with light polarized along the tip axis. We establish scaling relations for the scattered field amplitude…

Aperture based scanning near field optical microscopes are important instruments to study light at the nanoscale and to understand the optical functionality of photonic nanostructures. In general, a detected image is affected by both, the…

In analogy with optical near-field scanning methods, we use tapered dielectric waveguides as probes for a millimeter wave vector network analyzer. By scanning thin samples between two such probes we are able to map the spatially varying…

Scanning probe microscopy (SPM) is traditionally based on very sharp tips, where the small size of the apex is critical for resolution. This paradigm is about to shift, since a novel generation of planar probes (color centers in diamond,…

Interactions between atomic and molecular objects are to a large extent defined by the nanoscale electrostatic potentials which these objects produce. We introduce a scanning probe technique that enables three-dimensional imaging of local…

A new method for high-sensitivity subwavelength spectromicroscopy is proposed based on the usage of a spaser (near-field laser) in the form of a scanning probe microscope tip. The high spatial resolution is defined by the tip's curvature,…

We propose to measure the surface charge accumulating at the interface between a plasma and a dielectric by infrared spectroscopy using the dielectric as a multi-internal reflection element. The surplus charge leads to an attenuation of the…

Multi-tip scanning tunneling microscopy (STM) is a powerful method to perform charge transport measurements at the nanoscale. With four STM tips positioned on the surface of a sample, four-point resistance measurements can be performed in…

We propose a novel probe technique capable of performing local low-temperature spectroscopy on a 2D electron system (2DES) in a semiconductor heterostructure. Motivated by predicted spatially-structured electron phases, the probe uses a…

In scanning gate microscopy, where the tip of a scanning force microscope is used as a movable gate to study electronic transport in nanostructures, the shape and magnitude of the tip-induced potential are important for the resolution and…