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Quantifying the temperature of microdevices is critical for probing nanoscale energy transport.Such quantification is often accomplished by integrating resistance thermometers into microdevices. However, such thermometers frequently become…

介观与纳米尺度物理 · 物理学 2021-05-05 Amin Reihani , Shen Yan , Yuxuan Luan , Rohith Mittapally , Edgar Meyhofer , Pramod Reddy

Electronic conduction pathways in dielectric thin films are explored using automated experiments in scanning probe microscopy (SPM). Here, we use large field of view scanning to identify the position of localized conductive spots and…

We present the design and experimental results of a near-field scanning microwave microscope (NSMM) working at a frequency of 1GHz. Our microscope is unique in that the sensing probe is separated from the excitation electrode to…

材料科学 · 物理学 2009-11-13 K. Lai , M. B. Ji , N. Leindecker , M. A. Kelly , Z. X. Shen

A new method to characterize microwave electromagnetic absorption of a bulk carbon nanotube material is proposed and experimentally evaluated in this paper. The method is based on the measurement of microwave transmission through a…

应用物理 · 物理学 2020-08-26 O. Malyuskin , P. Brunet , D. Mariotti , R. McGlynn , P. Maguire

The electronic transport and the sensing performance of an individual SnO2 crossed nanowires device in a three-terminal field effect configuration were investigated using a combination of macroscopic transport measurements and Scanning…

材料科学 · 物理学 2009-11-11 S. V. Kalinin , J. Shin , S. Jesse , D. Geohegan , A. P. Baddorf , Y. Lilach , M. Moskovits , A. Kolmakov

Scanning Thermal Microscopy (SThM) uses micromachined thermal sensors integrated in a force sensing cantilever with a nanoscale tip can be highly useful for exploration of thermal management of nanoscale semiconductor devices. As well as…

介观与纳米尺度物理 · 物理学 2015-05-30 P. Tovee , M. Pumarol , D. Zeze , Kevin Kjoller , O. Kolosov

This paper the utilizes atomistic-continuum mechanics (ACM) to investigate the mechanical properties of single-walled carbon nanotubes (SWCNTs). By establishing a linkage between structural mechanics and molecular mechanics, not only the…

材料科学 · 物理学 2007-08-13 C. -J. Wu , C. -Y. Chou , C. -N. Han , K. -N. Chiang

Scattering scanning near-field optical microscopy (s-SNOM) is a promising technique for overcoming Abbe diffraction limit and substantially enhancing the spatial resolution in spectroscopic imaging. The s-SNOM works by exposing an atomic…

量子物理 · 物理学 2024-03-22 Soheil Khajavi , Zahra Shaterzadeh-Yazdi , Ali Eghrari , Mohammad Neshat

Electron field emission characteristics of individual multiwalled carbon nanotubes have been investigated by a piezoelectric nanomanipulation system operating inside a scanning electron microscopy chamber. The experimental setup ensures a…

A theoretical description of ESR in 1D interacting metals is given, with primary emphasis on carbon nanotubes. The spin-orbit coupling is derived, and the resulting ESR spectrum is analyzed by field theory and exact diagonalization. Drastic…

强关联电子 · 物理学 2009-11-07 A. De Martino , R. Egger , K. Hallberg , C. A. Balseiro

We use scanning photocurrent microscopy (SPCM) to investigate individual suspended semiconducting carbon nanotube devices where the potential profile is engineered by means of local gates. In situ tunable p-n junctions can be generated at…

介观与纳米尺度物理 · 物理学 2014-08-07 Gilles Buchs , Maria Barkelid , Salvatore Bagiante , Gary A. Steele , Val Zwiller

We present a new concept of scanning thermal nanoprobe that utilizes the extreme thermal conductance of a carbon nanotube (CNT) to channel heat between the probe and the sample. The integration of CNT in scanning thermal microscopy (SThM)…

介观与纳米尺度物理 · 物理学 2013-05-28 Peter D. Tovee , Manuel E. Pumarol , Mark C. Rosamond , Robert Jones , Michael C. Petty , Dagou A. Zeze , Oleg V. Kolosov

A simple, reliable method for preparation of bulk Cr tips for Scanning Tunneling Microscopy (STM) is proposed and its potentialities in performing high-quality and high-resolution STM and Spin Polarized-STM (SP-STM) are investigated. Cr…

Carbon nanomembranes (CNMs) are nanometer-thin disordered carbon materials that are suitable for a range of applications, from energy generation and storage, through to water filtration. The structure-property relationships of these…

The influence of defects on electron transport in single-wall carbon nanotube field effect transistors (CNFETs) is probed by combined scanning gate microscopy (SGM) and scanning impedance microscopy (SIM). SGM reveals a localized field…

介观与纳米尺度物理 · 物理学 2009-11-07 Marcus Freitag , Sergei V. Kalinin , Dawn A. Bonnell , A. T. Johnson

We report a method for probing electromechanical properties of multiwalled carbon nanotubes(CNTs). This method is based on AFM measurements on a doubly clamped suspended CNT electrostatically deflected by a gate electrode. We measure the…

介观与纳米尺度物理 · 物理学 2009-11-11 R. Lefevre , M. F. Goffman , V. Derycke , C. Miko , L. Forro , J. P. Bourgoin , P. Hesto

Spin resonance of single spin centers bears great potential for chemical structure analysis, quantum sensing and quantum coherent manipulation. Essential for these experiments is the presence of a two-level spin system whose energy…

介观与纳米尺度物理 · 物理学 2020-01-08 Philip Willke , Aparajita Singha , Xue Zhang , Taner Esat , Christopher P. Lutz , Andreas J. Heinrich , Taeyoung Choi

In this work we fabricate and characterize a functionalized superconducting (SC) Nb tip of a scanning tunnelling microscope (STM). The tip is functionalized with a Tetracyanoquinodimethane molecule (TCNQ) that accepts charge from the tip…

We developed a process to fabricate nanoscale metallic gate electrodes on scanning probe cantilevers, including on the irregular surface of protruding cantilever tips. The process includes a floating-layer technique to coat the cantilevers…

仪器与探测器 · 物理学 2022-09-26 Luca Forrer , Aurèle Kamber , Armin Knoll , Martino Poggio , Floris Braakman

We have developed a simple and reliable technique for two-terminal transport measurements of free-standing wire-like objects. The method is based on the low-energy electron point source microscope. The field emission tip of the microscope…

介观与纳米尺度物理 · 物理学 2009-11-07 P. Dorozhkin , H. Nejoh , D. Fujita