相关论文: White light interferometry analysis for measuring …
In-camera light scattering is a typical form of non-systematic interference in indirect Time-of-Flight (iToF) cameras, primarily caused by multiple reflections and optical path variations within the camera body. This effect can…
A procedure for measuring material thickness by means of necessarily-long acoustic wavelengths is examined. The approach utilizes a temporal phase lag caused by the impulse time of wave momentum transferred through a thin layer that is much…
Brownian thermal noise associated with highly reflective coatings is a fundamental limit for several precision experiments, including gravitational-wave detectors. Research is currently ongoing to find coatings with low thermal noise that…
We demonstrate a suspended thin-film aluminum nitride (AlN) microbolometer for narrowband very long-wave infrared detection. The device uses a 100-nm-thick AlN membrane suspended above a Pt back reflector by a 1-um air gap. Resonant…
We present a direct experimental investigation of the optical field distribution around a suspended tapered optical nanofiber by means of a fluorescent scanning probe. Using a 100 nm diameter fluorescent bead as a probe of the field…
Free-space time domain THz spectroscopy accesses electrodynamic responses in a frequency regime ideally matched to interacting condensed matter systems. However, THz spectroscopy is challenging when samples are physically smaller than the…
Filled arrays of bolometers are currently being employed for use in astronomy from the far-infrared through millimeter parts of the electromagnetic spectrum. Because of the large range of wavelengths for which such detectors are applicable,…
Microscopes and various forms of interferometers have been used for decades in optical metrology of objects that are typically larger than the wavelength of light {\lambda}. However, metrology of subwavelength objects was deemed impossible…
Thin-film lithium niobate (TFLN) has emerged as a promising platform for the realization of high performance chip-scale optical systems, spanning a range of applications from optical communications to microwave photonics. Such applications…
Grazing incidence x-ray scattering provides nanostructural information for thin film samples, but single images generally do not provide information on film thickness or the full complex index of refraction. Additionally, for thin films…
To design semiconductor-based optical devices, the optical properties of the used semiconductor materials must be precisely measured over a large band. Transmission spectroscopy stands out as an inexpensive and widely available method for…
Long baseline diffraction-limited optical aperture synthesis technology by interferometry plays an important role in scientific study and practical application. In contrast to amplitude (phase) interferometry, intensity interferometry --…
Black phosphorus thin films might offer attractive alternatives to narrow gap compound semiconductors for optoelectronics across mid- to near-infrared frequencies. In this work, we calculate the optical conductivity tensor of multilayer…
Nonlinear interferometry has widespread applications in sensing, spectroscopy, and imaging. However, most implementations require highly reflective mirrors and precise optical alignment, drastically reducing their versatility and usability…
We present a novel single-shot interferometric ToF camera targeted for precise 3D measurements of dynamic objects. The camera concept is based on Synthetic Wavelength Interferometry, a technique that allows retrieval of depth maps of…
We introduce an interferometric technique for passive time-of-flight imaging and depth sensing at micrometer axial resolutions. Our technique uses a full-field Michelson interferometer, modified to use sunlight as the only light source. The…
Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon oxide surfaces. It is a convenient tool to quickly…
A long-held vision has been to realize diffraction-limited optical aperture synthesis over kilometer baselines. This will enable imaging of stellar surfaces and their environments, and reveal interacting gas flows in binary systems. An…
Planar metamaterials have been recently proposed for thin dielectric film sensing in the terahertz frequency range. Although the thickness of the dielectric film can be very small compared with the wavelength, the required area of sensed…
Thermoreflectance methods by picosecond pulse heating and by nanosecond pulse heating have been developed under the same geometrical configuration as the laser flash method by the National Metrology Institute of JAPAN, AIST. Using these…