相关论文: White light interferometry analysis for measuring …
Thermal conductivity and interfacial thermal conductance play crucial roles in the design of engineering systems where temperature and thermal stress are of concerns. To date, a variety of measurement techniques are available for both bulk…
We present an optical setup that can be used to characterize the thicknesses of thin NbN films to screen samples for fabrication and to better model the performance of the resulting superconducting nanowire single photon detectors. The…
We demonstrate a simple and quick method for the measurement of the in-plane thermal conductance of thin films via steady-state IR thermography. The films are suspended above a hole in an opaque substrate and heated by a homogeneous visible…
THz time domain spectroscopy is a powerful technique enabling the investigation of different materials in the far-infrared frequency range. Even if nowadays this technique is well established, its application to very thin films remains…
The ultimate detection limit of optical biosensors is often limited by various noise sources, including those introduced by the optical measurement setup. While sophisticated modifications to instrumentation may reduce noise, a simpler…
In semiconductor manufacturing processes, silicon dioxide films are commonly used as barrier layers, insulating layers, and protective layers. Coherence scanning interferometry (CSI) offers thin film thickness measurements with a…
We have developed a white light interferometric microscope (WLIM), which can spatially resolve the change in the complex index of refraction and apply it to study reversible photodegradation of 1,4-Diamino-9,10-anthraquinone doped into…
We have used a photothermal technique, in which chopped light heats the front surface of a small ( ~ 1 mm2) sample and the chopping frequency dependence of thermal radiation from the back surface is measured with a liquid nitrogen cooled…
In stellar interferometry, image quality improves significantly with the inclusion of more telescopes and the use of phase closure. We demonstrate, using first coherent and then partially coherent white light, a compact and efficient…
A large number of current and future experiments in neutrino and dark matter detection use the scintillation light from noble elements as a mechanism for measuring energy deposition. The scintillation light from these elements is produced…
We design a spectrally resolved interferometer to measure the refractive index of transparent samples over a broad spectral range between 400 and 550 nm. The measuring device consists of a Michelson interferometer whose output is analysed…
High resolution imaging is achieved using increasingly larger apertures and successively shorter wavelengths. Optical aperture synthesis is an important high-resolution imaging technology used in astronomy. Conventional long baseline…
The optical interferometry has been widely used in various high precision applications. Usually, the minimum precision of an interferometry is limited by various technique noises in practice. To suppress such kind of noises, we propose a…
We present a robust, precise, and accurate method to simultaneously measure the refractive indices of two transparent materials within an interference coating. This is achieved by measuring both a photometrically accurate transmittance…
We experimentally demonstrate imaging in the longwave-infrared (LWIR) spectral band (8um to 12um) using a single polymer flat lens based upon multi-level diffractive optics. The device thickness is only 10{\mu}m, and chromatic aberrations…
Optical spectroscopy is a fundamental tool in numerous areas of science and technology. Much effort has focused on miniaturizing spectrometers, but thus far at the cost of high spectral resolution and broad operating range. Here, we…
In this study we present an interferometric technique based on multiple wavelengths to capture the transient free surface contour of nanoliter drops spreading on a wettable surface, in particular close to the three-phase contact line.…
High-precision surface roughness estimation plays an important role in many applications. However, the classical estimating methods are limited by shot noise and only can achieve the precision of 0.1 nm with white light interferometer.…
This work discusses an extension to conventional low-coherence interferometry by the introduction of dispersion-encoding. The extension facilitates the measurement of surface height profiles with sub-nm resolution. The selection of a…
Indium tin oxide (ITO) film, which is the most commonly used transparent conductive film (TCF), has traditionally been believed to be transparent in the visible spectrum but to reflect infrared (IR) light beyond the plasma wavelength…