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The near field scanning optical microscopy (NSOM) is not only a tool for imaging of objects in the sub wavelength limit but also a prominent characteristic tool for understanding the intrinsic properties of the nanostructures. The effect of…

材料科学 · 物理学 2017-05-16 A. K. Sivadasan , Kishore K. Madapu , Prajit Dhara

Low-energy electron microscopy (LEEM) is a surface science method that works primarily in the UHV environment. It provides information complementary to the other established techniques: it extends the limited view of scanning probe…

介观与纳米尺度物理 · 物理学 2025-07-16 Jan Čechal , Pavel Procházka

High resolution nanoscale imaging in liquid environments is crucial for studying molecular interactions in biological and chemical systems. In particular, electron microscopy is the gold-standard tool for nanoscale imaging, but its…

软凝聚态物质 · 物理学 2015-07-20 Wayne Yang , Yuning Zhang , Michael Hilke , Walter Reisner

Transmission electron microscopy (TEM) is carried out in vacuum to minimize the interaction of the imaging electrons with gas molecules while passing through the microscope column. Nevertheless, in typical devices, the pressure remains at…

介观与纳米尺度物理 · 物理学 2019-01-25 Gregor T. Leuthner , Stefan Hummel , Clemens Mangler , Timothy J. Pennycook , Toma Susi , Jannik C. Meyer , Jani Kotakoski

We present feasibility study of an accelerator-based ultrafast transmission electron microscope (u-TEM) capable of producing a full field image in a single-shot with simultaneous picosecond temporal resolution and nanometer spatial…

加速器物理 · 物理学 2014-06-11 D. Xiang , F. Fu , J. Zhang , X. Huang , L. Wang , X. Wang , W. Wan

Single-pixel imaging, originally developed in light optics, facilitates fast three-dimensional sample reconstruction, as well as probing with light wavelengths undetectable by conventional multi-pixel detectors. However, the spatial…

Optical null medium (ONM) has garnered significant attention in electromagnetic wave manipulation. However, existing ONM implementations suffer from either narrow operational bandwidths or low efficiency. Here, we demonstrate an…

光学 · 物理学 2025-05-20 Yichao Liu , Jiale Li , Fei Sun , Qin Liao , Hanchuan Chen , Ruihang Deng

Opto-electronic devices utilizing graphene have already demonstrated unique capabilities, which are much more difficult to realize with conventional technologies. However, the requirements in terms of material quality and uniformity are…

Understanding and manipulating two-dimensional materials for real-world applications remains challenging due to a lack of effective and high-throughput characterization techniques. Soft X-ray time-of-flight photoemission electron microscopy…

材料科学 · 物理学 2025-12-22 Aashwin Mishra , Daniel Ratner , Quynh Nguyen

This comprehensive review discusses the development of scanning electron microscopy and the application of this technology in different fields such as biology, nanobiotechnology and biomedical science. Besides being a tool for high…

定量方法 · 定量生物学 2023-11-02 Aniruddha Acharya

Accelerator-based MeV ultrafast electron microscope (MUEM) has been proposed as a promising tool to study structural dynamics at the nanometer spatial scale and picosecond temporal scale. Here we report experimental tests of a prototype…

Ultrasound vascular imaging is limited by acoustic diffraction, restricting visualization of microvessels essential for understanding organ function and disease. Label-free super-resolution methods exploiting endogenous red blood cells have…

Ultra-fast transmission electron microscopy (UTEM) combines sub-picosecond time-resolution with the versatility of TEM spectroscopies. It allows one to study the dynamics of materials properties combining complementary techniques. However,…

材料科学 · 物理学 2021-08-25 S. Meuret , L. H. G. Tizei , F. Houdellier , S. Weber , Y. Auad , M. Tencé , H. -C. Chang , M. Kociak , A. Arbouet

Scanning Electron Microscopy (SEM) is indispensable in modern materials science, enabling high-resolution imaging across a wide range of structural, chemical, and functional investigations. However, SEM imaging remains constrained by…

The ability to perform nanometer-scale optical imaging and spectroscopy is key to deciphering the low-energy effects in quantum materials, as well as vibrational fingerprints in planetary and extraterrestrial particles, catalytic…

The dynamics of photo-excited charge carriers, particularly their transport and interactions with defects and interfaces, play an essential role in determining the performance of a wide range of solar and optoelectronic devices. A thorough…

材料科学 · 物理学 2017-08-07 Bolin Liao , Ebrahim Najafi

We present the development of the first ultrafast transmission electron microscope (UTEM) driven by localized photoemission from a field emitter cathode. We describe the implementation of the instrument, the photoemitter concept and the…

*To be published in Springer Handbook of Surface Science (Springer Verlag) [Preprint]* The capability to display images containing chemical, magnetic and structural information and to perform spectroscopy and diffraction from a {\mu}m-sized…

介观与纳米尺度物理 · 物理学 2018-12-06 Alessandro Sala

Scattering-type scanning near-field optical microscopy (s-SNOM) allows for the observation of the optical response of material surfaces with a resolution far below the diffraction limit. Based on amplitude-modulation atomic force microscopy…