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Memory designs require timing margins to compensate for aging and fabrication process variations. With technology downscaling, aging mechanisms became more apparent, and larger margins are considered necessary. This, in return, means a…

硬件体系结构 · 计算机科学 2022-12-20 Cemil Cem Gursoy , Daniel Kraak , Foisal Ahmed , Mottaqiallah Taouil , Maksim Jenihhin , Said Hamdioui

As the CMOS technology pushes to the nanoscale, aging effects and process variations have become increasingly pronounced, posing significant reliability challenges for AI accelerators. Traditional guardband-based design approaches, which…

硬件体系结构 · 计算机科学 2026-01-21 Meng Li , Tong Xie , Zuodong Zhang , Runsheng Wang

Reliability is a crucial requirement in any modern microprocessor to assure correct execution over its lifetime. As mission critical components are becoming common in commodity systems; e.g., control of autonomous cars, the demand for…

硬件体系结构 · 计算机科学 2020-09-10 Freddy Gabbay , Avi Mendelson

Industry 4.0 has become a driver for the entire manufacturing industry. Smart systems have enabled 30% productivity increases and predictive maintenance has been demonstrated to provide a 50% reduction in machine downtime. So far, the…

系统与控制 · 电气工程与系统科学 2023-04-11 Taner Dosluoglu , Martin MacDonald

In the era of Industry 4.0, system reliability engineering faces both challenges and opportunities. On the one hand, the complexity of cyber-physical systems, the integration of novel numerical technologies, and the handling of large…

The design of embedded safety-critical systems such as those used in next-generation automotive and autonomous platforms, is increasingly challenged by escalating system complexity, hardware-software heterogeneity, and the integration of…

CMOS technology scaling makes aging effects an important concern for the design and fabrication of integrated circuits. Aging deterioration reduces the useful life of a circuit, making it fail earlier. This deterioration can affect all…

The pivotal issue of reliability is one of colossal concern for circuit designers. The driving force is transistor aging, dependent on operating voltage and workload. At the design time, it is difficult to estimate close-to-the-edge…

机器学习 · 计算机科学 2024-02-07 Paul R. Genssler , Hamza E. Barkam , Karthik Pandaram , Mohsen Imani , Hussam Amrouch

Artificial intelligence (AI) and Machine Learning (ML) are becoming pervasive in today's applications, such as autonomous vehicles, healthcare, aerospace, cybersecurity, and many critical applications. Ensuring the reliability and…

硬件体系结构 · 计算机科学 2021-03-31 Shamik Kundu , Kanad Basu , Mehdi Sadi , Twisha Titirsha , Shihao Song , Anup Das , Ujjwal Guin

Artificial intelligence (AI) and machine learning (ML) techniques have been increasingly used in several fields to improve performance and the level of automation. In recent years, this use has exponentially increased due to the advancement…

Reliability is a fundamental requirement in any microprocessor to guarantee correct execution over its lifetime. The design rules related to reliability depend on the process technology being used and the expected operating conditions of…

硬件体系结构 · 计算机科学 2021-09-14 Freddy Gabbay , Avi Mendelson

Integrated circuits (ICs) are essential to modern electronic systems, yet they face significant risks from physical reverse engineering (RE) attacks that compromise intellectual property (IP) and overall system security. While IC camouflage…

密码学与安全 · 计算机科学 2025-08-13 Junling Fan , David Koblah , Domenic Forte

An indispensable part of our lives, computing has also become essential to industries and governments. Steady improvements in computer hardware have been supported by periodic doubling of transistor densities in integrated circuits over the…

新兴技术 · 计算机科学 2015-01-09 Igor L. Markov

The expansive globalization of the semiconductor supply chain has introduced numerous untrusted entities into different stages of a device's lifecycle. To make matters worse, the increase complexity in the design as well as aggressive time…

Reliability management is one of the primary concerns in manycore systems design. Different aging mechanisms such as Negative-Bias Temperature Instability (NBTI), Electromigration (EM), and thermal cycling can reduce the reliability of…

分布式、并行与集群计算 · 计算机科学 2024-08-15 Fatemeh Hossein Khani , Omid Akbari , Muhammad Shafique

Consumer and defense systems demanded design and manufacturing of electronics with increased performance, compared to their predecessors. As such systems became ubiquitous in a plethora of domains, their application surface increased, thus…

密码学与安全 · 计算机科学 2022-08-19 Abhijitt Dhavlle

Transistor aging phenomena manifest themselves as degradations in the main electrical characteristics of transistors. Over time, they result in a significant increase of cell propagation delay, leading to errors due to timing violations,…

硬件体系结构 · 计算机科学 2022-03-16 Konstantinos Balaskas , Georgios Zervakis , Hussam Amrouch , Joerg Henkel , Kostas Siozios

Embedded digital devices are progressively deployed in dependable or safety-critical systems. These devices undergo significant hardware ageing, particularly in harsh environments. This increases their likelihood of failure. It is crucial…

硬件体系结构 · 计算机科学 2025-04-21 Leandro Lanzieri , Gianluca Martino , Goerschwin Fey , Holger Schlarb , Thomas C. Schmidt , Matthias Wählisch

The growth of Internet of Things devices has shown the need to develop the direction of information security in the field of development and operation of microcircuits, since modern information systems are built around the latter. This…

密码学与安全 · 计算机科学 2023-01-31 D. S. Belyakov , E. O. Kalinin , A. A. Konev , A. A. Shelupanov , A. K. Novokhrestov

Power electronics converters are key enablers in the global energy transition for power generation, industrial and mobility applications; they convert electrical power in a controlled, reliable and efficient manner. The semiconductor…

系统与控制 · 电气工程与系统科学 2025-05-13 Amin Rezaeizadeh , Silvia Mastellone
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