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相关论文: ILILT: Implicit Learning of Inverse Lithography Te…

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As the feature size of integrated circuits continues to decrease, optical proximity correction (OPC) has emerged as a crucial resolution enhancement technology for ensuring high printability in the lithography process. Recently, level…

图像与视频处理 · 电气工程与系统科学 2023-11-01 Xing-Yu Ma , Shaogang Hao

Inverse Lithography Technology (ILT) has emerged as a promising solution for photo mask design and optimization. Relying on multi-beam mask writers, ILT enables the creation of free-form curvilinear mask shapes that enhance printed wafer…

计算机视觉与模式识别 · 计算机科学 2024-11-13 Haoyu Yang , Haoxing Ren

Optical lithography is the main enabler to semiconductor manufacturing. It requires extensive processing to perform the Resolution Enhancement Techniques (RETs) required to transfer the design data to a working Integrated Circuits (ICs).…

机器学习 · 计算机科学 2024-04-09 Mohamed S. E. Habib , Hossam A. H. Fahmy , Mohamed F. Abu-ElYazeed

As integrated circuit (IC) dimensions shrink below the lithographic wavelength, optical lithography faces growing challenges from diffraction and process variability. Model-based optical proximity correction (OPC) and inverse lithography…

机器学习 · 计算机科学 2025-12-25 Yuting Hu , Lei Zhuang , Hua Xiang , Jinjun Xiong , Gi-Joon Nam

Optical proximity correction (OPC) is crucial for pushing the boundaries of semiconductor manufacturing and enabling the continued scaling of integrated circuits. While pixel-based OPC, termed as inverse lithography technology (ILT), has…

人工智能 · 计算机科学 2024-09-02 Guojin Chen , Haoyu Yang , Haoxing Ren , Bei Yu , David Z. Pan

Large Language Models (LLMs) have demonstrated great performance in few-shot In-Context Learning (ICL) for a variety of generative and discriminative chemical design tasks. The newly expanded context windows of LLMs can further improve ICL…

We present Integer Linear Programming (ILP) Modulo Theories (IMT). An IMT instance is an Integer Linear Programming instance, where some symbols have interpretations in background theories. In previous work, the IMT approach has been…

计算机科学中的逻辑 · 计算机科学 2013-04-09 Panagiotis Manolios , Vasilis Papavasileiou

A core capability of intelligent systems is the ability to quickly learn new tasks by drawing on prior experience. Gradient (or optimization) based meta-learning has recently emerged as an effective approach for few-shot learning. In this…

机器学习 · 计算机科学 2019-09-11 Aravind Rajeswaran , Chelsea Finn , Sham Kakade , Sergey Levine

By exploiting the correlation between the structure and the solution of Mixed-Integer Linear Programming (MILP), Machine Learning (ML) has become a promising method for solving large-scale MILP problems. Existing ML-based MILP solvers…

机器学习 · 计算机科学 2025-01-03 Yixuan Li , Can Chen , Jiajun Li , Jiahui Duan , Xiongwei Han , Tao Zhong , Vincent Chau , Weiwei Wu , Wanyuan Wang

Deep Learning in Image Registration (DLIR) methods have been tremendously successful in image registration due to their speed and ability to incorporate weak label supervision at training time. However, existing DLIR methods forego many of…

计算机视觉与模式识别 · 计算机科学 2025-05-06 Rohit Jena , Pratik Chaudhari , James C. Gee

Creating visual layouts is a critical step in graphic design. Automatic generation of such layouts is essential for scalable and diverse visual designs. To advance conditional layout generation, we introduce BLT, a bidirectional layout…

计算机视觉与模式识别 · 计算机科学 2022-07-26 Xiang Kong , Lu Jiang , Huiwen Chang , Han Zhang , Yuan Hao , Haifeng Gong , Irfan Essa

Machine learning (ML) based interatomic potentials are emerging tools for materials simulations but require a trade-off between accuracy and speed. Here we show how one can use one ML potential model to train another: we use an existing,…

材料科学 · 物理学 2022-09-20 Joe D. Morrow , Volker L. Deringer

Inverse design (ID) is a computational method that systematically explores a design space to find optimal device geometries based on specific performance criteria. In silicon photonics, ID often leads to devices with design features that…

系统与控制 · 电气工程与系统科学 2024-10-11 Shaheer Khan , Mustafa Hammood , Nicolas A. F. Jaeger , Lukas Chrostowski

VLSI mask optimization is one of the most critical stages in manufacturability aware design, which is costly due to the complicated mask optimization and lithography simulation. Recent researches have shown prominent advantages of machine…

机器学习 · 计算机科学 2019-12-17 Haoyu Yang , Wei Zhong , Yuzhe Ma , Hao Geng , Ran Chen , Wanli Chen , Bei Yu

Intelligent reflecting surface (IRS) has been recently employed to reshape the wireless channels by controlling individual scattering elements' phase shifts, namely, passive beamforming. Due to the large size of scattering elements, the…

信号处理 · 电气工程与系统科学 2020-09-01 Shimin Gong , Jiaye Lin , Jinbei Zhang , Dusit Niyato , Dong In Kim , Mohsen Guizani

Inverse medium scattering is an ill-posed, nonlinear wave-based imaging problem arising in medical imaging, remote sensing, and non-destructive testing. Machine learning (ML) methods offer increased inference speed and flexibility in…

Recently Implicit Neural Representations (INRs) gained attention as a novel and effective representation for various data types. Thus far, prior work mostly focused on optimizing their reconstruction performance. This work investigates INRs…

图像与视频处理 · 电气工程与系统科学 2022-08-05 Yannick Strümpler , Janis Postels , Ren Yang , Luc van Gool , Federico Tombari

Iterative Learning Control (ILC) can achieve perfect tracking performance for mechatronic systems. The aim of this paper is to present an ILC design tutorial for industrial mechatronic systems. First, a preliminary analysis reveals the…

系统与控制 · 电气工程与系统科学 2020-05-05 Tom Oomen

Recent advances in photonic inverse design have demonstrated the ability to automatically synthesize compact, high-performance photonic components that surpass conventional, hand-designed structures, offering a promising path toward…

光学 · 物理学 2026-02-18 Hongjian Zhou , Haoyu Yang , Nicholas Gangi , Tianle Xu , Rena Huang , Jiaqi Gu

As feature sizes shrink to the nanometer scale, accurately transferring circuit patterns from photomasks to silicon wafers becomes increasingly challenging. Optical proximity correction (OPC) is widely used to ensure pattern fidelity and…

计算机视觉与模式识别 · 计算机科学 2026-05-14 Yuting Hu , Lei Zhuang , Chen Wang , Ruiyang Qin , Hua Xiang , Gi-joon Nam , Jinjun Xiong
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