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Transient reflectivity measurements of thin films, ranging from 6 to 40 nm in thickness, of the topological insulator Bi2Se3 revealed a strong dependence of the carrier relaxation time on the film thickness. For thicker films the relaxation…

介观与纳米尺度物理 · 物理学 2015-06-17 Yuri D. Glinka , Sercan Babakiray , Trent A. Johnson , Mikel B. Holcomb , David Lederman

Ultrafast carrier dynamics in the topological insulator Bi2Se3 have recently been intensively studied using a variety of techniques. However, we are not aware of any successful experiments exploiting transient absorption (TA) spectroscopy…

介观与纳米尺度物理 · 物理学 2021-05-31 Yuri D. Glinka , Junzi Li , Tingchao He , Xiao Wei Sun

Understanding interfacial interactions in two-dimensional (2D) heterostructures is essential for advancing optoelectronic and quantum technologies. We investigate metal-organic chemical vapor deposition (MOCVD)-grown WSe$_2$ films (one to…

Transient reflectivity (TR) from thin films (6 - 40 nm thick) of the topological insulator Bi2Se3 reveal ultrafast carrier dynamics, which suggest the existence of both radiative and non-radiative recombination between electrons residing in…

介观与纳米尺度物理 · 物理学 2015-06-23 Yuri D. Glinka , Sercan Babakiray , Trent A. Johnson , Mikel B. Holcomb , David Lederman

We present molecular dynamics simulations of a realistic model of an ultrathin film of BaTiO$_3$ sandwiched between short-circuited electrodes to determine and understand effects of film thickness, epitaxial strain and the nature of…

材料科学 · 物理学 2009-11-13 Jaita Paul , Takeshi Nishimatsu , Y. Kawazoe , Umesh V. Waghmare

Since the first report of ferroelectricity in nanoscale HfO$_2$-based thin films in 2011, this silicon-compatible binary oxide has quickly garnered intense interest in academia and industry, and continues to do so. Despite its deceivingly…

材料科学 · 物理学 2024-08-27 Tianyuan Zhu , Liyang Ma , Shiqing Deng , Shi Liu

Transient reflectivity (TR) measured at laser photon energy 1.51 eV from the indirectly intersurface coupled topological insulator Bi2-xMnxSe3 films (12 nm thick) revealed a strong dependence of the rise-time and initial decay-time…

介观与纳米尺度物理 · 物理学 2016-04-20 Yuri D. Glinka , Sercan Babakiray , Mikel B. Holcomb , David Lederman

We measure the remnant polarization of ferroelectric domains in BiFeO3 films down to 3.6 nm using low energy electron and photoelectron emission microscopy. The measured polarization decays strongly below a critical thickness of 5-7 nm…

Atomic-scale ferroelectric thin films hold great promise for high-density, low-power applications but face stability and voltage scaling challenges at extreme thinness. Here, we demonstrate ferroelectricity in single-crystalline…

The coupling of light to electrical charge carriers in semiconductors is the foundation of many technological applications. Attosecond transient absorption spectroscopy measures simultaneously how excited electrons and the vacancies they…

材料科学 · 物理学 2023-05-03 Z. Schumacher , S. A. Sato , S. Neb , A. Niedermayr , L. Gallmann , A. Rubio , U. Keller

The quasiparticle spectra of atomically thin semiconducting transition metal dichalcogenides (TMDCs) and their response to an ultrafast optical excitation critically depend on interactions with the underlying substrate. Here, we present a…

Two-dimensional (2D) bismuth oxyselenide (Bi2O2Se) with high electron mobility is advantageous in future high-performance and flexible electronic and optoelectronic devices. However, transfer of thin Bi2O2Se flakes is rather challenging,…

材料科学 · 物理学 2020-08-25 Wenjun Chen , Usman Khan , Simin Feng , Baofu Ding , Xiaomin Xu , Bilu Liu

Scanning tunneling microscopy and spectroscopy have been used to investigate the femtosecond dynamics of Dirac fermions in the topological insulator Bi$_2$Se$_3$ ultrathin films. At two-dimensional limit, bulk electrons becomes quantized…

介观与纳米尺度物理 · 物理学 2015-05-08 Can-Li Song , Lili Wang , Ke He , Shuai-Hua Ji , Xi Chen , Xu-Cun Ma , Qi-Kun Xue

The observation of ferroelectric, ferromagnetic and ferroelastic phases in thin films of binary oxides attract the broad interest of scientists and engineers. However, the theoretical consideration of observed behaviour physical nature was…

材料科学 · 物理学 2020-12-08 Maya Glinchuk , Anna Morozovska , Lesya Yurchenko

The discovery of ferroelectric polarization in HfO2-based ultrathin films has spawned a lot of interest due to their potential applications in data storage. Recently, a new R3m rhombohedral phase was proposed to be responsible for the…

材料科学 · 物理学 2020-07-29 Yuke Zhang , Qiong Yang , Lingling Tao , Evgeny Y. Tsymbal , Vitaly Alexandrov

We grew a 2 micron thick film of single-phase BiFeO3 on a Si (100) substrate by pulsed laser deposition with a substrate temperature of 575 oC and an oxygen partial pressure of 0.06 mbar. X ray diffraction analysis indicated that the film…

材料科学 · 物理学 2025-04-04 Ramachandran Balakrishnan , Ambesh Dixit , Mamidanna Sri Ramachandra Rao

Transition metal dichalcogenides (TMDs) have recently attracted attention due to their interesting electronic and optical properties. Fabrication of these materials in a reliable and facile method is important for future applications, as…

The transport properties, resistance, Hall effect, and low T magnetoresistance for very oxygen overdoped nonsuperconducting Bi2Sr2CuO6+d (Bi2201) thin films are reported. From 20 to 300K, the temperature dependence of the resistance is well…

超导电性 · 物理学 2023-04-13 H. Raffy , Z. Z. Li , P. Auban-Senzier

This work examines the influence of thickness on the electrical transport properties of mechanically exfoliated two-dimensional SnSe$_2$ nanosheets, derived from the bulk single crystal. Contrary to conventional trend observed in…

介观与纳米尺度物理 · 物理学 2025-09-15 Aarti Lakhara , Lars Thole , Rolf J. Haug , P. A. Bhobe

Carrier transport in nanodevices plays a crucial role in determining their functionality. In the post-Moore era, the behavior of carriers near surface or interface domains the function of the whole devices. However, the femtosecond dynamics…

介观与纳米尺度物理 · 物理学 2024-03-19 Yangguang Zhong , Shuai Yue , Huawei Liu , Yuexing Xia , Anlian Pan , Shula Chen , Xinfeng Liu
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