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A detailed investigation of the structural and vibrational properties of various prestressed silicon nitride membranes patterned with one-dimensional photonic crystal structures is presented. The tensile stress-related deformation of the…

应用物理 · 物理学 2022-05-20 Ali A. Darki , Robin V. Nielsen , Jens V. Nygaard , Aurélien Dantan

Classical molecular-dynamics simulations have been carried out to investigate densification mechanisms in silicon dioxide thin films deposited on an amorphous silica surface, according to a simplified ion-beam assisted deposition (IBAD)…

材料科学 · 物理学 2009-11-07 Alexis Lefevre , Laurent J. Lewis , Ludvik Martinu , Michael R. Wertheimer

We demonstrate a method to induce tensile and compressive strain into two-dimensional transition metal dichalcogenide (TMDC) MoS$_{2}$ via the deposition of stressed thin films to encapsulate exfoliated flakes. With this technique we can…

介观与纳米尺度物理 · 物理学 2021-07-15 Tara Peña , Shoieb A. Chowdhury , Ahmad Azizimanesh , Arfan Sewaket , Hesam Askari , Stephen M. Wu

Chromium thin films deposited on silicon substrates by DC magnetron sputtering were systematically investigated as a function of film thickness, using a DC power of 50 W and a post-deposition annealing temperature of 200 C. Two types of…

材料科学 · 物理学 2025-10-29 M. D. Medina , H. I. Giron , K. Paucar , A. Talledo , B. R. Pujada

Here, we report the full-fledged journey towards the material synthesis and characterization of few-layered/thin WSe$_2$ using sputtered W-films on SiO$_2$/Si substrates followed by electrical studies under dark and illumination conditions.…

In this work, the results of fabricating ultra thin VO$_2$ films on the technologically relevant amorphous SiO$_2$ surface using reactive DC magnetron sputtering are presented. Results indicate that a post deposition anneal in low partial…

材料科学 · 物理学 2016-08-16 Fangfang Song , B. E. White

We report on the electrical properties of polycrystalline NbO2 thin film vertical devices grown on TiN coated SiO2/Si substrates using pulsed laser deposition. First, we analyzed the thickness and contact size dependences of threshold…

应用物理 · 物理学 2018-10-17 Toyanath Joshi , Pavel Borisov , David Lederman

Magnetic relaxation and critical current density have been measured on a $MgB_2$ thin film in a wide region of temperature with the magnetic field up to 8 T. The irreversibility line has also been determined. It is found that the relaxation…

超导电性 · 物理学 2009-11-07 H. H. Wen , S. L. Li , Z. W. Zhao , H. Jin , Y. M. Ni , W. N. Kang , H. J. Kim , E. M. Choi , S. I. Lee

We propose a theoretical study for Si thin film thickness measurement that is based on incident low energy electron beam on the film and counting the transmitted/incident electron fraction. It estimates the thin film thickness distribution…

To study the effect of stress within the thin amorphous film generated atop Si irradiated by Ar+, we model the film as a viscoelastic medium into which the ion beam continually injects biaxial compressive stress. We find that at normal…

数学物理 · 物理学 2015-06-03 Scott A. Norris

In this paper, the bulge test is used to determine the mechanical properties of very thin dielectric membranes. Commonly, this experimental method permits to determine the residual stress (s0) and biaxial Young's modulus (E/(1-u)).…

其他计算机科学 · 计算机科学 2008-12-18 P. Martins , C. Malhaire , S. Brida , D. Barbier

MgB2 thin films were deposited on SiC buffered Si substrates by sequential electron beam evaporation of B-Mg bilayer followed by in-situ annealing. The application of a SiC buffer layer enables the maximum annealing temperature of 830 C.…

超导电性 · 物理学 2009-11-11 S. Chromik , J. Huran , V. Strbik , M. Spankova , I. Vavra , W. Bohne , J. Rohrich , E. Strub , P. Kovac , S. Stancek

This study aims towards a systematic reciprocity of the tunable synthesis parameters - partial pressure of N$_2$ gas, ion energy (\Ei) and Ti interface in TiN thin film samples deposited using ion beam sputtering at ambient temperature…

材料科学 · 物理学 2020-06-22 Susmita Chowdhury , Rachana Gupta , Shashi Prakash , Layanta Behera , D. M. Phase , Mukul Gupta

We report on the realization of silicon nitride membranes with enhanced and electrically tunable reflectivity. A subwavelength one-dimensional grating is directly patterned on a suspended 200 nm-thick, high stress commercial film using…

介观与纳米尺度物理 · 物理学 2020-01-08 Bhagya Nair , Andreas Naesby , Bjarke R. Jeppesen , Aurélien Dantan

We report the reduction in residual stress of AlN thin films and also the crystal structure, surface morphology and nanomechanical properties of magnetron sputtered as a function of substrate temperature (Ts, 35 - 600 ?C). The residual…

材料科学 · 物理学 2017-07-25 Padmalochan Panda , R. Ramaseshan , N Ravi , G. Mangamma , Feby Jose , S. Dash , K. Suzuki , H. Suematsu

The residual stress plays a vital role in determination of the device performance that uses thin films coating and thus the accurate determination of stress and its optimization with process parameters is an ongoing research work for many…

Buckled membranes become ever more important with further miniaturization and development of ultra-thin film based systems. It is well established that the bulge test method, generally considered the gold standard for characterizing…

应用物理 · 物理学 2018-08-23 Salman Shafqat , Olaf van der Sluis , Marc Geers , Johan Hoefnagels

Investigations of free-standing liquid films enjoy an increasing popularity due to their relevance for many fundamental and applied scientific problems. They constitute soap bubbles and foams, serve as membranes for gas transport or as…

Recently, lattice dynamics of the highly strained europium monoxide, as a promising candidate for strong ferroelectric-ferromagnet material, applied in the next-generation storage devices, attracted huge attention in the solid-state…

材料科学 · 物理学 2019-09-23 Alireza Kashir , Hyeon-Woo Jeong , Woochan Jung , Yoon Hee Jeong , Gil-Ho Lee

A new concept of micromachines has been developed for measuring the mechanical properties of thin metallic films. The actuator is a beam undergoing large internal stresses built up during the deposition process. Al thin films are deposited…

其他计算机科学 · 计算机科学 2007-11-29 D. Fabrègue , Nicolas André , T. Pardoen , J. P. Raskin
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