相关论文: Counterfeit Chip Detection using Scattering Parame…
Semiconductor intellectual property (IP) theft incurs hundreds of billions in annual losses, driven by advanced reverse engineering (RE) techniques. Traditional ``cryptic'' IC camouflaging methods typically focus on hiding localized gate…
Robust control and maintenance of the grid relies on accurate data. Both PMUs and state estimators are prone to false data injection attacks. Thus, it is crucial to have a mechanism for fast and accurate detection of an agent maliciously…
The motor control board has various defects such as inconsistent color differences, incorrect plug-in positions, solder short circuits, and more. These defects directly affect the performance and stability of the motor control board,…
An important tool in the field of metamaterials is the extraction of effective material parameters from simulated or measured scattering parameters of a sample. Here we discuss a retrieval method for thin-film structures that can be…
Recently discovered Spectre and meltdown attacks affects almost all processors by leaking confidential information to other processes through side-channel attacks. These vulnerabilities expose design flaws in the architecture of modern…
Counterfeit apps impersonate existing popular apps in attempts to misguide users to install them for various reasons such as collecting personal information or spreading malware. Many counterfeits can be identified once installed, however…
Counterfeit products cause severe harm to public safety and health by penetrating untrusted supply chains. Numerous anti-counterfeiting techniques have been proposed, among which the use of inherent, unclonable irregularities of paper…
Skipper Charge-Coupled Devices (Skipper-CCDs) are ultra-low-threshold detectors capable of detecting energy deposits in silicon at the eV scale. Increasingly used in rare-event searches, one of the major challenges in these experiments is…
Fingerprint recognition has drawn a lot of attention during last decades. Different features and algorithms have been used for fingerprint recognition in the past. In this paper, a powerful image representation called scattering…
Miniaturized, low-cost wavelength detectors are gaining enormous interest as we step into the new age of photonics. Incompatibility with integrated circuits or complex fabrication requirement in most of the conventionally used filters…
The semiconductor chip manufacturing process is complex and lengthy, and potential errors arise at every stage. Each wafer contains numerous chips, and wafer bin maps can be generated after chip testing. By analyzing the defect patterns on…
In this work, we consider error detection via simulation for reversible circuit architectures. We rigorously prove that reversibility augments the performance of this simple error detection protocol to a considerable degree. A single…
Particle track reconstruction capabilities of the silicon tracking detector system have been studied. As the multiple Coulomb scattering (MCS) induces unavoidable uncertainties on the coordinate measurement, the corresponding error…
Fabricating experimental pictures in research work is a serious academic misconduct, which should better be detected in the reviewing process. However, due to large number of submissions, the detection whether a picture is fabricated or…
Microwave reflectance probed photoconductivity (or $\mu$-PCD) measurement represents a contactless and non-invasive method to characterize impurity content in semiconductors. Major drawbacks of the method include a difficult separation of…
Anti-counterfeiting technologies are indeed crucial for information security and protecting product authenticity. Traditional anti-counterfeiting methods have their limitations due to their clonable nature. Exploring new technologies,…
We propose Schmitt-Trigger (ST) based recycling sensor that are tailored to amplify the aging mechanisms and detect fine grained recycling (minutes to seconds). We exploit the susceptibility of ST to process variations to realize…
We introduce a robust numerical technique to verify the causality of sampled scattering parameters given on a finite bandwidth. The method is based on a filtered Fourier transform and includes a rigorous estimation of the errors caused by…
The purpose of this project is to investigate the use of charge couple devices (CCDs) to detect electrons directly. This can be done in transmission electron microscopy (TEM) for electrons over 100 KeV, but for space plasma instruments,…
High-performance and safety-critical system architects must accurately evaluate the application-level silent data corruption (SDC) rates of processors to soft errors. Such an evaluation requires error propagation all the way from particle…