相关论文: A novel approach for wafer defect pattern classifi…

Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…

Topological data analysis (TDA) is a rapidly developing collection of methods for studying the shape of point cloud and other data types. One popular approach, designed to be robust to noise and outliers, is to first use a smoothing…

We present the application of topological data analysis (TDA) to study unweighted complex networks via their persistent homology. By endowing appropriate weights that capture the inherent topological characteristics of such a network, we…

Persistent homology is a tool from Topological Data Analysis (TDA) used to summarize the topology underlying data. It can be conveniently represented through persistence diagrams. Observing a noisy signal, common strategies to infer its…

Topological Data Analysis (TDA) is a novel, and relatively new approach to analysing high-dimensional data sets. It does this by focussing on global properties like the shape and connectivity of the data giving it a significant advantage…

Assessing the quality of 3D printed models before they are printed remains a challeng- ing problem, particularly when considering point cloud-based models. This paper introduces an approach to quality assessment, which uses techniques from…

Topological Data Analysis (TDA) can broadly be described as a collection of data analysis methods that find structure in data. This includes: clustering, manifold estimation, nonlinear dimension reduction, mode estimation, ridge estimation…

While conventional methods for sequential learning focus on interaction between consecutive inputs, we suggest a new method which captures composite semantic flows with variable-length dependencies. In addition, the semantic structures…

Machine learning for point clouds has been attracting much attention, with many applications in various fields, such as shape recognition and material science. For enhancing the accuracy of such machine learning methods, it is often…

Identifying the qualitative changes in time-series data provides insights into the dynamics associated with such data. Such qualitative changes can be detected through topological approaches, which first embed the data into a…

The language and methods of algebraic topology, particularly homotopy theory, have been extensively used in the study of the identification, the classification and the evolution of defects. Topological methods provide the means for the…

This paper introduces new methodology based on the field of Topological Data Analysis for detecting anomalies in multivariate time series, that aims to detect global changes in the dependency structure between channels. The proposed…

Convolutional neural networks (CNNs) have been established as the main workhorse in image data processing; nonetheless, they require large amounts of data to train, often produce overconfident predictions, and frequently lack the ability to…

Features play a crucial role in computer vision. Initially designed to detect salient elements by means of handcrafted algorithms, features are now often learned by different layers in Convolutional Neural Networks (CNNs). This paper…

Manufacturing wafers is an intricate task involving thousands of steps. Defect Pattern Recognition (DPR) of wafer maps is crucial for determining the root cause of production defects, which may further provide insight for yield improvement…

We introduce a new continual (or lifelong) learning algorithm called LDA-CP&S that performs segmentation tasks without undergoing catastrophic forgetting. The method is applied to two different surface defect segmentation problems that are…

Recently, semiconductors' demand has exploded in virtual reality, smartphones, wearable devices, the internet of things, robotics, and automobiles. Semiconductor manufacturers want to make semiconductors with high yields. To do this,…

Node2vec is a graph embedding method that learns a vector representation for each node of a weighted graph while seeking to preserve relative proximity and global structure. Numerical experiments suggest Node2vec struggles to recreate the…

Precision in identifying nanometer-scale device-killer defects is crucial in both semiconductor research and development as well as in production processes. The effectiveness of existing ML-based approaches in this context is largely…

Semiconductor manufacturing is on the cusp of a revolution: the Internet of Things (IoT). With IoT we can connect all the equipment and feed information back to the factory so that quality issues can be detected. In this situation, more and…