相关论文: A novel approach for wafer defect pattern classifi…

Under the banner of `Big Data', the detection and classification of structure in extremely large, high dimensional, data sets, is, one of the central statistical challenges of our times. Among the most intriguing approaches to this…

This paper proposes a new topology optimization method that applies a convolutional neural network (CNN), which is one deep learning technique for topology optimization problems. Using this method, we acquire a structure with a little…

The fingerprint classification problem is to sort fingerprints into pre-determined groups, such as arch, loop, and whorl. It was asserted in the literature that minutiae points, which are commonly used for fingerprint matching, are not…

Quality control is a fundamental component of many manufacturing processes, especially those involving casting or welding. However, manual quality control procedures are often time-consuming and error-prone. In order to meet the growing…

Topological data analysis (TDA), while abstract, allows a characterization of time-series data obtained from nonlinear and complex dynamical systems. Though it is surprising that such an abstract measure of structure - counting pieces and…

In machine-learning-assisted high-throughput defect studies, a defect-aware latent representation of the supercell structure is crucial to the accurate prediction of defect properties. The performance of current graph neural network (GNN)…

Topological defects play a key role in the structures and dynamics of liquid crystals (LCs) and other ordered systems. There is a recent interest in studying defects in different biological systems with distinct textures. However, a robust…

With the rapid growth in the semiconductor industry, it is becoming critical to detect and classify increasingly smaller patterned defects. Recently machine learning, including deep learning, has come to aid in this endeavor in a big way.…

This paper presents a deep learning approach for the classification of Engineering (CAD) models using Convolutional Neural Networks (CNNs). Owing to the availability of large annotated datasets and also enough computational power in the…

Active nematics is an emerging paradigm for characterising biological systems. One aspect of particularly intense focus is the role active nematic defects play in these systems, as they have been found to mediate a growing number of…

Defect detection in the manufacturing industry is of utmost importance for product quality inspection. Recently, optical defect detection has been investigated as an anomaly detection using different deep learning methods. However, the…

Topological Data Analysis (TDA) involves techniques of analyzing the underlying structure and connectivity of data. However, traditional methods like persistent homology can be computationally demanding, motivating the development of neural…

Recently a new feature representation and data analysis methodology based on a topological tool called persistent homology (and its corresponding persistence diagram summary) has started to attract momentum. A series of methods have been…

The patterns on wafer maps play a crucial role in helping engineers identify the causes of production issues during semiconductor manufacturing. In order to reduce costs and improve accuracy, automation technology is essential, and recent…

The dominant approach for surface defect detection is the use of hand-crafted feature-based methods. However, this falls short when conditions vary that affect extracted images. So, in this paper, we sought to determine how well several…

Feature extraction from persistence diagrams, as a tool to enrich machine learning techniques, has received increasing attention in recent years. In this paper we explore an adaptive methodology to localize features in persistent diagrams,…

Supervised machine learning pipelines trained on features derived from persistent homology have been experimentally observed to ignore much of the information contained in a persistence diagram. Computing persistence diagrams is often the…

Topological data analysis (TDA) is a versatile tool that can be used to extract scientific knowledge from complex pattern formation processes. However, the physics correspondence between the features obtained from TDA and pattern dynamics…

A topological defect network (TDN) is formed by a network of topological defects embedded within a topological quantum field theory (TQFT). TDNs were introduced recently for the purpose of describing fracton topological phases of matter…

Fasteners play a critical role in securing various parts of machinery. Deformations such as dents, cracks, and scratches on the surface of fasteners are caused by material properties and incorrect handling of equipment during production…