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Both the current upgrades to accelerator-based HEP detectors (e.g. ATLAS, CMS) and also future projects (e.g. CEPC, FCC) feature large-area silicon-based tracking detectors. We are investigating the feasibility of using CMOS foundries to…

The CMS detector is under construction for imminent operation at the Large Hadron Collider at CERN near Geneva, Switzerland. The installation and commissioning is performed in a surface hall. Thereafter, all the main heavy elements of the…

仪器与探测器 · 物理学 2008-05-14 Tim Christiansen

Reducing the incidence of surgical site infections (SSIs) is one of the objectives of the French nosocomial infection control program. Manual monitoring of SSIs is carried out each year by the hospital hygiene team and surgeons at the…

Formal verification of complex algorithms is challenging. Verifying their implementations goes beyond the state of the art of current automatic verification tools and usually involves intricate mathematical theorems. Certifying algorithms…

计算机科学中的逻辑 · 计算机科学 2013-02-01 Eyad Alkassar , Sascha Böhme , Kurt Mehlhorn , Christine Rizkallah

The Compact Muon Solenoid experiment at the Large Hadron Collider at CERN includes a silicon pixel detector as its innermost component. Its main task is the precise reconstruction of charged particles close to the primary interaction…

The CMS detector at the CERN LHC features a silicon pixel detector as its innermost subdetector. The original CMS pixel detector has been replaced with an upgraded pixel system (CMS Phase-1 pixel detector) in the extended year-end technical…

仪器与探测器 · 物理学 2020-12-29 The Tracker Group of the CMS Collaboration

The testing and quality assurance of cryogenic superconducting detectors is a time- and labor-intensive process. As experiments deploy increasingly larger arrays of detectors, new methods are needed for performing this testing quickly.…

天体物理仪器与方法 · 物理学 2025-05-27 K. R. Ferguson , A. N. Bender , N. Whitehorn , P. S. Barry , T. W. Cecil , K. R. Dibert , E. S. Martsen

The Large Hadron Collider (LHC) experiments ATLAS and CMS have established hybrid pixel detectors as the instrument of choice for particle tracking and vertexing in high rate and radiation environments, as they operate close to the LHC…

仪器与探测器 · 物理学 2018-06-27 Maurice Garcia-Sciveres , Norbert Wermes

The Framework is one of the subprojects of the Joint COntrols Project (JCOP), which is collaboration between the four LHC experiments and CERN. By sharing development, this will reduce the overall effort required to build and maintain the…

仪器与探测器 · 物理学 2007-05-23 M. Gonzalez-Berges

Cherenkov threshold detectors (XCET) are used for identifying particles in the experimental areas at CERN. These detectors observe Cherenkov light emitted by charged particles travelling inside a pressurized gas vessel. A key component of…

The series of upgrades to the Large Hadron Collider, culminating in the High Luminosity Large Hadron Collider, will enable a significant expansion of the physics program of the CMS experiment. However, the accelerator upgrades will also…

仪器与探测器 · 物理学 2022-05-25 M. Abbas , M. Abbrescia , H. Abdalla , A. Abdelalim , S. AbuZeid , A. Agapitos , A. Ahmad , A. Ahmed , W. Ahmed , C. Aimè , C. Aruta , I. Asghar , P. Aspell , C. Avila , J. Babbar , Y. Ban , R. Band , S. Bansal , L. Benussi , T. Beyrouthy , V. Bhatnagar , M. Bianco , S. Bianco , K. Black , L. Borgonovi , O. Bouhali , A. Braghieri , S. Braibant , S. D. Butalla , S. Calzaferri , M. Caponero , J. Carlson , F. Cassese , N. Cavallo , S. S. Chauhan , S. Colafranceschi , A. Colaleo , J. Collins , A. Conde Garcia , M. Dalchenko , A. De Iorio , G. De Lentdecker , D. Dell Olio , G. De Robertis , W. Dharmaratna , S. Dildick , B. Dorney , R. Erbacher , F. Fabozzi , F. Fallavollita , A. Ferraro , D. Fiorina , E. Fontanesi , M. Franco , C. Galloni , P. Giacomelli , S. Gigli , J. Gilmore , M. Gola , M. Gruchala , A. Gutierrez , T. Hakkarainen , J. Hauser , K. Hoepfner , M. Hohlmann , H. Hoorani , T. Huang , P. Iaydjiev , A. Irshad , A. Iorio , F. Ivone , W. Jang , J. Jaramillo , A. Juodagalvis , E. Juska , B. Kailasapathy , T. Kamon , Y. Kang , P. Karchin , A. Kaur , H. Kaur , H. Keller , H. Kim , J. Kim , S. Kim , B. Ko , A. Kumar , S. Kumar , N. Lacalamita , J. S. H. Lee , A. Levin , Q. Li , F. Licciulli , L. Lista , K. Liyanage , F. Loddo , M. Luhach , M. Maggi , Y. Maghrbi , N. Majumdar , K. Malagalage , S. Malhotra , S. Martiradonna , C. McLean , J. Merlin , M. Misheva , G. Mocellin , L. Moureaux , A. Muhammad , S. Muhammad , S. Mukhopadhyay , M. Naimuddin , S. Nuzzo , R. Oliveira , P. Paolucci , I. C. Park , L. Passamonti , G. Passeggio , A. Peck , A. Pellecchia , N. Perera , L. Petre , H. Petrow , D. Piccolo , D. Pierluigi , M. Rahmani , F. Ramirez , A. Ranieri , G. Rashevski , B. Regnery , M. Ressegotti , C. Riccardi , M. Rodozov , E. Romano , C. Roskas , B. Rossi , P. Rout , J. D. Ruiz , A. Russo , A. Safonov , A. K. Sahota , D. Saltzberg , G. Saviano , A. Shah , A. Sharma , R. Sharma , T. Sheokand , M. Shopova , F. M. Simone , J. Singh , U. Sonnadara , A. Stamerra , E. Starling , B. Stone , J. Sturdy , G. Sultanov , Z. Szillasi , D. Teague , D. Teyssier , T. Tuuva , M. Tytgat , I. Vai , N. Vanegas , R. Venditti , P. Verwilligen , W. Vetens , A. K. Virdi , P. Vitulo , A. Wajid , D. Wang , K. Wang , I. J. Watson , N. Wickramage , D. D. C. Wickramarathna , S. Yang , U. Yang , Y. Yang , J. Yongho , I. Yoon , Z. You , I. Yu , S. Zaleski

Machine-vision-based defect classification techniques have been widely adopted for automatic quality inspection in manufacturing processes. This article describes a general framework for classifying defects from high volume data batches…

计算机视觉与模式识别 · 计算机科学 2023-07-04 Wenbo Sun , Raed Al Kontar , Judy Jin , Tzyy-Shuh Chang

Deep Learning is emerging as an effective technique to detect sophisticated cyber-attacks targeting Industrial Control Systems (ICSs). The conventional approach to detection in literature is to learn the "normal" behaviour of the system, to…

密码学与安全 · 计算机科学 2021-04-16 Maged Abdelaty , Roberto Doriguzzi-Corin , Domenico Siracusa

Fast, non-destructive and on-site quality control tools, mainly high sensitive imaging techniques, are important to assess the reliability of photovoltaic plants. To minimize the risk of further damages and electrical yield losses,…

计算机视觉与模式识别 · 计算机科学 2020-10-01 Mathis Hoffmann , Bernd Doll , Florian Talkenberg , Christoph J. Brabec , Andreas K. Maier , Vincent Christlein

There is strong theoretical motivation for the study of events with 2 same-sign leptons, jets, and missing transverse energy (MET) at the Large Hadron Collider (LHC). There are many compelling models, for instance, supersymmetry and extra…

高能物理 - 实验 · 物理学 2015-05-14 Ronald Remington

For the Inner Tracking System 3 (ITS3) upgrade, the ALICE experiment at CERN requires monolithic active pixel sensors of dimensions up to 97~mm$\,\times\,$266~mm, occupying a large fraction of a 300 mm wafer. To manufacture such a…

In manufacturing processes, surface inspection is a key requirement for quality assessment and damage localization. Due to this, automated surface anomaly detection has become a promising area of research in various industrial inspection…

Capabilities and the number of vision-based models are increasing rapidly. And these vision models are now able to do more tasks like object detection, image classification, instance segmentation etc. with great accuracy. But models which…

计算机视觉与模式识别 · 计算机科学 2025-12-18 Parvesh Saini , Soumyadipta Maiti , Beena Rai

Automated detection of defects in Printed Circuit Board (PCB) manufacturing using Solder Paste Inspection (SPI) and Automated Optical Inspection (AOI) machines can help improve operational efficiency and significantly reduce the need for…

机器学习 · 计算机科学 2023-09-07 Jubilee Prasad-Rao , Roohollah Heidary , Jesse Williams

Deep learning-based semiconductor defect inspection has gained traction in recent years, offering a powerful and versatile approach that provides high accuracy, adaptability, and efficiency in detecting and classifying nano-scale defects.…

计算机视觉与模式识别 · 计算机科学 2024-07-18 Amit Prasad , Bappaditya Dey , Victor Blanco , Sandip Halder