相关论文: Imaging Scatterometer for Observing Changes to Opt…
Annealing of amorphous optical coatings has been shown to generally reduce optical absorption, optical scattering, and mechanical loss, with higher temperature annealing giving better results. The achievable maximum temperatures are limited…
Light scattered by amorphous thin-film optical coatings limits the sensitivity of interferometric gravitational-wave detectors. We describe an imaging scatterometer to assess the role that crystal growth during annealing plays in this…
High reflective coatings are used in many physics experiments. Despite the high quality of the opticalcoating, the performances of the mirrors is altered by the scattered light induced by micrometers sizedefects in the coating layers. The…
Optical coatings formed from amorphous oxide thin films have many applications in precision measurements. The Advanced Laser Interferometer Gravitational-Wave Observatory (LIGO) and Advanced Virgo use coatings of SiO$_2$ (silica) and…
We observed and studied strong reduction of optical reflection from the surface of InP wafers after high-temperature annealing. The effect is observed over a wide range of the incident wavelengths, and in the transparency band of the…
In laser gravitational waves detectors optical loss restricts sensitivity. We discuss polarization scattering as one more possible mechanism of optical losses. Circulated inside interferometer light is polarized and after reflection its…
Many adaptive optics systems operate by measuring the distortion of the wavefront in one wavelength range and performing the scientific observations in a second, different wavelength range. One common technique is to measure wavefront…
We investigate the influence of oxygen annealing on the room temperature optical and scintillation properties of CaWO$_4$ single crystals that are being produced for direct Dark Matter search experiments. The applied annealing procedure…
Many optical measurement techniques, such as light scattering from wavelength-scale particles or detecting motion from a surface with an optical lever, encode information in a complex radiation pattern. Extracting all available information…
Photons preferentially Compton scatter perpendicular to the plane of polarisation. This property can be exploited to design instruments to measure the linear polarisation of hard X-rays ($\sim$10 - 100 keV). Photons may undergo two…
We present a simple measurement and analysis technique to determine the fraction of optical loss due to both radiation (scattering) and linear absorption in microphotonic components. The method is generally applicable to optical materials…
Solid-state dewetting phenomenon in silver thin films offers a straightforward method to obtain structures having controlled shape or size -this latter in principle spanning several orders of magnitudes -- with potentially strong interest…
The presence of a scattering medium in the imaging path between an object and an observer is known to severely limit the visual acuity of the imaging system. We present an approach to circumvent the deleterious effects of scattering, by…
We present a theory for the cloaking of arbitrarily-shaped objects and demonstrate electromagnetic scattering-cancellation through designed homogeneous coatings. First, in the small-particle limit, we expand the dipole moment of a coated…
The scattering cancellation technique is a powerful tool to reduce the scattered field from electrically small objects in a specific frequency window. The technique relies on covering the object of interest with a shell that scatters light…
Online measurement of diameters and concentricities of optical fibre layers, and the coating layer in particular, is one of the challenges in fibre manufacturing. Currently available instruments can measure concentricity and diameter of…
In this work We report on the extensive characterization of amorphous silicon carbide (a-SiC) coatings prepared by physical deposition methods. We compare the results obtained on two different sputtering systems (a standard RF magnetron…
We present an optical metrology system for characterization of topography of micro/nano-structures on a surface or embedded in a semi-transparent material. Based on the principles of scatterometry, where the intensity of scattered light is…
A new experimental equipment allowing to study the sputtering induced by ion beam irradiation is presented. The sputtered particles are collected on a catcher which is analyzed in situ by Auger electron spectroscopy without breaking the…
Recording and identifying faint objects through atmospheric scattering media by an optical system are fundamentally interesting and technologically important. In this work, we introduce a comprehensive model that incorporates contributions…