相关论文: Weighted ellipse fitting routine for spotty or inc…

We present a procedure for fitting an ellipse to powder diffraction patterns recorded on a planar 2D detector, which uses the peak intensities as weights. This procedure works for complete and spotty diffraction rings. We outline all the…

A new procedure aiming at folding a powder diffraction 2-D into a 1-D scan is presented. The technique consists of three steps: tracking the beam centre by means of a Simulated Annealing (SA) of the diffraction rings along the same axis,…

Next-generation, atomically thin devices require in-plane, one-dimensional heterojunctions to electrically connect different two-dimensional (2D) materials. However, the lattice mismatch between most 2D materials leads to unavoidable…

A new instrument for spot profile analysis of electron diffraction - SPA-LEED - has been set up. The instrument works either with a transparent phosphor screen for visual inspection of the pattern or in its main mode with a channeltron for…

We introduce a new adaptive and fully Bayesian grid-based method to model strong gravitational lenses with extended images. The primary goal of this method is to quantify the level of luminous and dark-mass substructure in massive galaxies,…

This paper introduces a practical and accurate calibration method for camera spectral sensitivity using a diffraction grating. Accurate calibration of camera spectral sensitivity is crucial for various computer vision tasks, including color…

Development in lattice strain mapping using four-dimensional scanning transmission electron microscopy (4D-STEM) method now offers improved precision and feasibility. However, automatic and accurate diffraction analysis is still challenging…

We propose a new algorithm for real-time detection and tracking of elliptic patterns suitable for real-world robotics applications. The method fits ellipses to each contour in the image frame and rejects ellipses that do not yield a good…

In this chapter, we demonstrate a general formulation of the Finite Element Method allowing to calculate the diffraction efficiencies from the electromagnetic field diffracted by arbitrarily shaped gratings embedded in a multilayered stack…

The prediction of Debye-Scherrer diffraction patterns from strained samples is typically conducted in the small strain limit. Although valid for small deviations from the hydrostat (such as the conditions of finite strength typically…

In integrated photonics, specific wavelengths are preferred such as 1550 nm due to low-loss transmission and the availability of optical gain in this spectral region. For chip-based photodetectors, layered two-dimensional (2D) materials…

Ellipse and ellipsoid fitting has been extensively researched and widely applied. Although traditional fitting methods provide accurate estimation of ellipse parameters in the low-noise case, their performance is compromised when the noise…

The recently proposed reduction method is applied to the Edwards-Anderson model on bond-diluted square lattices. This allows, in combination with a graph-theoretical matching algorithm, to calculate numerically exact ground states of large…

Two-dimensional (2D) materials are among the most studied ones nowadays, because of their unique properties. These materials are made of, single- or few atom-thick layers assembled by van der Waals forces, hence allowing a variety of…

Nanoscale strain mapping by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a sequence of diffraction patterns, a task which is complicated by…

We develop a new method to estimate gravitational shear by adopting an elliptical weight function to measure background galaxy images. In doing so, we introduce a new concept of "zero plane" which is an imaginal source plane where shapes of…

Understanding mechanical properties of materials requires not only complete determination of the three-dimensional response at a local scale, but also knowledge of the mode or the mechanism by which deformation takes place. Probing…

Spectroscopic ellipsometry is a powerful method with high surface sensitivity that can be used to monitor the growth of even sub-monolayer film. However, the analysis of ultrathin films is complicated by the correlation of the dielectric…

We implement the Elliptical Gauss-Laguerre (EGL) galaxy-shape measurement method proposed by Bernstein & Jarvis (2002) and quantify the shear recovery accuracy in weak lensing analysis. This method uses a deconvolution fitting scheme to…

Large variety of optical full-field measurement techniques are being developed and applied to solve mechanical problems. Since each technique possess its own merits, it is important to know the capabilities and limitations of such…