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We investigate polariton-polariton interactions in a semiconductor microcavity through two-dimensional Fourier transform (2DFT) spectroscopy. We observe, in addition to the lower-lower and the upper-upper polariton self-interaction, a…

介观与纳米尺度物理 · 物理学 2015-10-28 N. Takemura , S. Trebaol , M. D. Anderson , V. Kohnle , Y. Léger , D. Y. Oberli , M. T. Portella-Oberli , B. Deveaud

We have experimentally studied polarization properties of the two-dimensional coupled photonic crystal microcavity arrays, and observed a strong polarization dependence of the transmission and reflection of light from the structures - the…

光学 · 物理学 2009-11-10 Hatice Altug , Jelena Vuckovic

The refraction of light in an optical medium is not only a subject of fundamental interest, but the refractive index also plays a crucial role in applications involving integrated and non-linear optics. One such application is photon-pair…

光学 · 物理学 2025-08-22 Stefan Kazmaier , Kaisa Laiho

The PCI diagnostic is an internal reference interferometer that creates an image of absolutely calibrated electron density fluctuations integrated along the line of sight of the probing light beam. While conventional PCI diagnostics…

仪器与探测器 · 物理学 2023-10-18 Alessandro Marinoni , John Chris Rost , Miklos Porkolab

The band alignment of semiconductor-metal interfaces plays a vital role in modern electronics, but remains difficult to predict theoretically and measure experimentally. For interfaces with strong band bending a main difficulty originates…

Photothermal microscopy is an emerging tool for measuring light-matter interactions with single-molecule sensitivity. It is generally believed that the spectral acquisition speed in photothermal microscopy is limited by the slow thermal…

A new instrument for spot profile analysis of electron diffraction - SPA-LEED - has been set up. The instrument works either with a transparent phosphor screen for visual inspection of the pattern or in its main mode with a channeltron for…

材料科学 · 物理学 2015-01-30 U. Scheithauer , G. Meyer , M. Henzler

Precise knowledge of resonator dispersion, from both geometric and material contributions, is essential for reliable high-performance nonlinear integrated photonics devices, such as optical parametric oscillators, frequency doublers, and…

光学 · 物理学 2026-01-28 Ergun Simsek , Shao-Chien Ou , Gregory Moille , Kartik Srinivasan

Pulsar dynamic spectra exhibit high visibility fringes arising from interference between scattered radio waves. These fringes may be random or highly ordered patterns, depending on the nature of the scattering or refraction. Here we…

天体物理学 · 物理学 2009-11-10 Mark Walker , Dan Stinebring

We experimentally and theoretically studied a new left-handed (LH) structure based on a photonic crystal (PC) with a negative refractive index. The structure consists of triangular array of rectangular dielectric bars with dielectric…

材料科学 · 物理学 2007-05-23 R. Moussa , S. Foteinopoulou , Lei Zhang , G. Tuttle , K. Guven , E. Ozbay , C. M. Soukoulis

We present an imaging technique that allows the recovery of the transparency profile of wavelength-scale objects with deep subwavelength resolution based on far-field intensity measurements. The approach, interscale mixing microscopy (IMM),…

光学 · 物理学 2017-03-21 Sandeep Inampudi , Nicholas Kuhta , Viktor A. Podolskiy

Metal-dielectric layered stacks for imaging with sub-wavelength resolution are regarded as linear isoplanatic systems - a concept popular in Fourier Optics and in scalar diffraction theory. In this context, a layered flat lens is a…

光学 · 物理学 2010-09-21 Rafal Kotynski

Microplastic pollution studies depend on reliable identification of the suspicious particles. Out of the various analytical techniques available to characterize them, infrared transflectance using a tuneable mid-IR quantum cascade laser is…

The ability to resolve the polarization of light with on-chip devices represents an urgent problem in optoelectronics. The detectors with polarization resolution demonstrated so far mostly require multiple oriented detectors or movable…

介观与纳米尺度物理 · 物理学 2022-05-19 Valentin Semkin , Dmitry Mylnikov , Elena Titova , Sergey Zhukov , Dmitry Svintsov

Microwave reflectance probed photoconductivity (or $\mu$-PCD) measurement represents a contactless and non-invasive method to characterize impurity content in semiconductors. Major drawbacks of the method include a difficult separation of…

应用物理 · 物理学 2019-12-18 B. Gyüre-Garami , B. Blum , O. Sági , A. Bojtor , S. Kollarics , G. Csősz , B. G. Márkus , J. Volk , F. Simon

A method of scanning mid-IR-laser microscopy has recently been proposed for the investigation of large-scale electrically and recombination-active defects in semiconductors and non-destructive inspection of semiconductor materials and…

材料科学 · 物理学 2011-05-17 O. V. Astafiev , V. P. Kalinushkin , V. A. Yuryev

X-ray crystallography (XC) is an experimental technique used to determine three-dimensional crystalline structures. The acquired data in XC, called diffraction patterns, is the Fourier magnitudes of the unknown crystalline structure. To…

图像与视频处理 · 电气工程与系统科学 2019-07-09 Samuel Pinilla , Jorge Bacca , Cesar Vargas , Juan Carlos Poveda-Jaramillo , Henry Arguello

Interferometry techniques are essential for extracting phase information from optical systems, enabling precise measurements of dispersion and highly sensitive detection of perturbations. While phase sensing offers enhanced sensitivity…

Photon transport through a diffusing slab can be described by the radiative transfer equation (RTE). When the slab is highly scattering and weakly absorbing, the RTE simplifies to the diffusion equation. In this paper, an inverse diffusion…

Integrated photonic chips have significant potential in telecommunications, classic computing, quantum systems, and topological photonics. Direct laser writing offers unique capability for creating three-dimensional photonic devices in an…