相关论文: Fully automated spectroscopic ellipsometry analyse…

This article deals with quantitative error analysis resulting from ellipsometric data obtained from measurement on curved surfaces including the influence of non-collimated beams. Numerical model based on the combination of geometrical and…

A novel method nicknamed ELASTIC is proposed for the alignment of multiple-aperture telescopes, in particular segmented telescopes. It only needs the acquisition of two diversity images of an unresolved source, and is based on the…

We present an assessment of a multi-method approach based on ion beam analysis to obtain high-resolution depth profiles of the total chemical composition of complex alloy systems. As a model system we employ an alloy based on several…

Spectroscopic photoemission microscopy is a well-established method to investigate the electronic structure of surfaces. In modern photoemission microscopes the electron optics allows imaging of the image plane, momentum plane, or…

We investigated the optical properties of 13 different dielectric materials (slide glass, quartz, Al2O3 (c-cut), DyScO3 (110), KTaO3 (001), LaAlO3 (001), (LaAlO3)0.3-(Sr2AlTaO6)0.7 (001) (LSAT), MgF2 (100), MgO (100), SiC, SrTiO3 (001),…

We study the optical and electrical properties of silver films with a graded thickness obtained through metallic evaporation in vacuum on a tilted substrate to evaluate their use as semitransparent electrical contacts. We measure their…

Electron ptychography describes a family of algorithms which are used to enable the reconstruction of complex specimen transmission functions of a sample in order to obtain both phase and amplitude information, as applied within the realms…

Electromagnetic interaction between a sub-wavelength particle (the `probe') and a material surface (the `sample') is studied theoretically. The interaction is shown to be governed by a series of resonances corresponding to surface polariton…

Fully energy-filtered X-ray photoelectron emission microscopy is used to analyze the spatial distribution of the silicon sub-oxide structure at the SiO2/Si interface as a function of underlying doping pattern. Using a spectroscopic…

Transmission electron diffraction is a powerful and versatile structural probe for the characterization of a broad range of materials, from nanocrystalline thin films to single crystals. With recent developments in fast electron detectors…

Phase is a fundamental resource for optical imaging but cannot be directly observed with intensity measurements. The existing methods to quantify a phase distribution rely on complex devices and structures. Here we experimentally…

The electronic wavefunctions of an atom or molecule are affected by its interactions with its environment. These interactions dictate electronic and optical processes at interfaces, and is especially relevant in the case of thin film…

The fields of view of Extremely Large Telescopes will contain vast numbers of spatial sampling elements (spaxels) as their Adaptive Optics systems approach the diffraction limit over wide fields. Since this will exceed the detection…

We describe a spin-resolved electron spectrometer capable of uniquely efficient and high energy resolution measurements. Spin analysis is obtained through polarimetry based on low-energy exchange scattering from a ferromagnetic thin-film…

A new material characterization technique is emerging for the transmission electron microscope (TEM). Using electron energy-loss spectroscopy, real space mappings of the underlying electronic transitions in the sample, so called orbital…

A simple, yet general, formalism for the optimized linear combination of astrophysical images is constructed and demonstrated. The formalism allows the user to combine multiple undersampled images to provide oversampled output at high…

Programmable electron-beam scanning offers new opportunities to improve dose efficiency and suppress scan-induced artifacts in scanning transmission electron microscopy. Here, we systematically benchmark the impact of non-raster…

An integrated microscope that combines different optical techniques for simultaneous imaging is demonstrated. The microscope enables spectral-domain optical coherence microscopy based on optical backscatter, and multi-photon microscopy for…

The price of instruments and observing time on modern telescopes is quickly increasing with the size of the primary mirror. Therefore, it is worth revisiting the data reduction algorithms to extract every bit of scientific information from…

All spectrometers rely on some mechanism to achieve spectral selectivity; common examples include gratings, prisms, and interferometers with moving mirrors. We experimentally demonstrated and validated a spectroscopic technique -- here…