相关论文: Fully automated spectroscopic ellipsometry analyse…
Optical spectroscopy is an important and widely used technique, for instance, to characterize new materials and to identify unknown compounds. Spectra are typically reported as a function of the wavelength of light, yet the information…
We explore the use of remapping techniques to improve the efficiency of highly-multiplexed fibre systems for astronomical spectroscopy. This is particularly important for the implementation of Diverse Field Spectroscopy (DFS, described in…
We present a fully parameter-free density-functional approach for the accurate description of optical absorption spectra of insulators, semiconductors and metals. We show that this can be achieved within time-dependent…
Electron matter interactions in electron microscopy produce both elastic and inelastic scattering, forming the basis for imaging and spectroscopy. However, the integration of electron energy loss spectroscopy (EELS) with 4D-STEM and…
We report optical characterization of PtSi films for thermoelectric device applications by nondestructive spectroscopic ellipsometry (SE). Pt monolayer and Pt-Si multilayer which consists of 3 pairs of Pt and Si layers were deposited on…
Layered materials (LMs) are at the centre of an ever increasing research effort due to their potential use in a variety of applications. The presence of imperfections, such as bi- or multilayer areas, holes, grain boundaries, isotropic and…
Recent advances in detectors and computer science have enabled the acquisition and the processing of multidimensional datasets, in particular in the field of spectral imaging. Benefiting from these new developments, earth scientists try to…
We have demonstrated the capability of spectral multiplexing in multi-distance diffractive imaging, enabling the reconstruction of samples with diverse spectral responses. While previous methods like ptychography utilize redundancy in…
Detecting elliptical objects from an image is a central task in robot navigation and industrial diagnosis where the detection time is always a critical issue. Existing methods are hardly applicable to these real-time scenarios of limited…
Chiral spectroscopy is a powerful technique that enables to identify the chirality of matter through optical means. So far, experiments to check the chirality of matter or nanostructures have been carried out using free-space propagating…
We describe a new algorithm for the "perfect" extraction of one-dimensional spectra from two-dimensional (2D) digital images of optical fiber spectrographs, based on accurate 2D forward modeling of the raw pixel data. The algorithm is…
Microscopes face a trade-off between spatial resolution, field-of-view, and frame rate -- improving one of these properties typically requires sacrificing the others, due to the limited spatiotemporal throughput of the sensor. To overcome…
Multi-object or integral field spectrographs are recognized techniques for achieving simultaneous spectroscopic observations of different or extended sky objects with a high multiplex factor. In this communication is described a…
Spectral imaging is a fundamental diagnostic technique with widespread application. Conventional spectral imaging approaches have intrinsic limitations on spatial and spectral resolutions due to the physical components they rely on. To…
Dielectric tensor tomography is an imaging technique for mapping three-dimensional distributions of dielectric properties in transparent materials. This work introduces an enhanced illumination strategy employing a micro-electromechanical…
Elliptical slice sampling, when adapted to linearly truncated multivariate normal distributions, is a rejection-free Markov chain Monte Carlo method. At its core, it requires analytically constructing an ellipse-polytope intersection. The…
An optical microscope is described that reveals contrast in the Mueller matrix images of a thin, transparent or semi-transparent specimen located within an anisotropic object plane (anisotropic filter). The specimen changes the anisotropy…
Spectroscopic ellipsometry is a sensitive and optical model-supported quantitative tool to monitor interfaces. In this work, solid-liquid interfaces are studied using the Kretschmann-Raether configuration for biosensing applications. The…
Spectroscopic ellipsometry is used to determine the dielectric function of the superconducting LaFeAsO$_{0.9}$F$_{0.1}$ ($T_c$ = 27 K) and undoped LaFeAsO polycrystalline samples in the wide range 0.01-6.5 eV at temperatures 10 $\leq T…
Understanding mechanical properties of materials requires not only complete determination of the three-dimensional response at a local scale, but also knowledge of the mode or the mechanism by which deformation takes place. Probing…