相关论文: Precision of silicon oxynitride refractive-index p…

The dispersive part of the refractive index of vanadium is determined by measuring the angular displacement of the first order diffraction peak of a V/Fe superlattice. The measurements were made using elliptically polarized synchrotron…

It is shown that reflective laser refractometery at Brewster angle can be usefull for precision measurements of refractive indexes (RI) in the transparency band of various films of nanoscale thickness. The RI measurements of nanoscale…

A new procedure aiming at folding a powder diffraction 2-D into a 1-D scan is presented. The technique consists of three steps: tracking the beam centre by means of a Simulated Annealing (SA) of the diffraction rings along the same axis,…

This paper introduces an innovative imaging method using reconfigurable intelligent surfaces (RISs) by combining radar coincidence imaging (RCI) and computational imaging techniques. In the proposed framework, RISs simultaneously redirect…

We present recent achievement on manufacturing optical filter and multilayers done with two complementary RF magnetron sputtering approaches: deposition duration control and in situ optical reflectance monitoring. Those approaches were…

In this communication, we report results of a high resolution sputter depth profiling analysis of a stack of 16 alternating MgO and ZnO nanolayers grown by atomic layer deposition (ALD) with thickness of ~5.5 nm per layer. We used an…

In this report, we applied integrated gradients to explaining a neural network for diabetic retinopathy detection. The integrated gradient is an attribution method which measures the contributions of input to the quantity of interest. We…

The refractive index of a matter is foundational to quantify the light-matter interaction of the medium. However, the classical description of refractive index is based on macroscopic homogenization and is limited to describing the local…

Nickel oxide (NiO) is a binary compound with a lot of applications in the present technology. NiO thin films were deposited by reactive sputtering magnetron under several voltage biases applied in the glass substrates (0, 50, 100, 200, 300,…

We propose an efficient method to determine the effective refractive index of step-index optical fibers from the visible to the mid-IR and thus allowing to infer their dispersive properties over a broad spectral range. The validity of the…

Conventional transparent materials at optical frequencies have refractive index values (n) greater than unity -- most commonly between about 1 and 4. This paper explores optical phenomena made possible by using materials with refractive…

Reflection statistics have not been well studied for optical random media whose mean refractive indices do not match with the refractive indices of their surrounding media. Here, we theoretically study how this refractive index mismatch…

In a previous paper, we reviewed theoretically some of the available processing schemes for X-ray wavefront sensing based on random modulation. We here show experimental applications of the technique for characterising both refractive and…

Optical diffraction tomography (ODT) provides three-dimensional refractive index (RI) tomograms of a transparent microscopic object. However, because of the finite numerical aperture of objective lenses, ODT has the limited access to…

Density-based Out-of-distribution (OOD) detection has recently been shown unreliable for the task of detecting OOD images. Various density ratio based approaches achieve good empirical performance, however methods typically lack a…

Object pose estimation from a single RGB image is a challenging problem due to variable lighting conditions and viewpoint changes. The most accurate pose estimation networks implement pose refinement via reprojection of a known, textured 3D…

Specular reflections pose a significant challenge for object segmentation, as their sharp intensity transitions often mislead both conventional algorithms and deep learning based methods. However, as the specular reflection must lie on the…

X-ray ptychography is one of the versatile techniques for nanometer resolution imaging. The magnitude of the diffraction patterns is recorded on a detector and the phase of the diffraction patterns is estimated using phase retrieval…

We present the intrinsic optical properties over a broad spectral range of TiN thin films deposited on a Si/SiO$_2$ substrate. We analyze the measured reflectivity spectra of the film-substrate multilayer structure within a well-establish…

Optical microscopy is believed to be an efficient method for identifying layer number of two-dimensional 2D materials. However, since illuminants, cameras and their parameters are different from lab to lab, it is impossible to identify…