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相关论文: Differential electron yield imaging with STXM

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Significant advancements have been made in understanding the physics of transition-edge sensors (TESs) over the past decade. However, key questions remain, particularly a detailed understanding of the current-dependent resistance of these…

The performance of a particle accelerator can be limited by the build-up of an electron cloud (EC) in the vacuum chamber. Secondary electron emission from the chamber walls can contribute to EC growth. An apparatus for in-situ measurements…

High-resolution transmission electron microscopy (HRTEM) is an important method for imaging beam sensitive materials often under cryo conditions. Electron ptychography in the scanning transmission electron microscope (STEM) has been shown…

材料科学 · 物理学 2025-09-19 Felix Bennemann , Angus I. Kirkland , David A. Muller , Peter Nellist

Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a…

Addressing the need for efficient and integrated multiscale crystallographic and defect analyses of advanced materials, this paper presents the implementation of a new multi-configuration detection system, integrating a single…

仪器与探测器 · 物理学 2026-05-19 Nohayla El-Khairaoui , Julien Guyon , Nathalie Gey , Luc Morhain , Nabila Maloufi

Heterogeneous catalysts are the most important catalysts in industrial reactions. Nanocatalysts, with size ranging from hundreds of nanometers to the atomic scale, possess activities that are closely connected to their structural…

材料科学 · 物理学 2018-06-13 Yong Zhu , Mingquan Xu , Wu Zhou

We have designed and implemented an experiment to measure the angular distributions and the energy spectra of the transition radiation X-rays emitted by fast electrons and positrons crossing different radiators. Our experiment was selected…

Using a time-resolved detection scheme in scanning transmission X-ray microscopy (STXM) we measured element resolved ferromagnetic resonance (FMR) at microwave frequencies up to 10\,GHz and a spatial resolution down to 20\,nm at two…

介观与纳米尺度物理 · 物理学 2019-07-01 T. Schaffers , T. Feggeler , S. Pile , R. Meckenstock , M. Buchner , D. Spoddig , V. Ney , M. Farle , H. Wende , S. Wintz , M. Weigand , H. Ohldag , K. Ollefs , A. Ney

Accurate characterization of quantum yield is crucial to the reconstruction of energy depositions in silicon at the eV scale. This work presents a new method for experimentally calculating quantum yield using vacuum UV-sensitive silicon…

Radiation-induced proportional-electroluminescence UV signals, emitted from the holes of a Thick Gas Electron Multiplier (THGEM) electrode immersed in liquid xenon, were recorded with a PMT for the first time. Significant photon yields were…

仪器与探测器 · 物理学 2015-06-17 L. Arazi , A. E. C. Coimbra , R. Itay , H. Landsman , L. Levinson , M. L. Rappaport , D. Vartsky , A. Breskin

Anomalous local photocurrent generation via second-order nonlinear and thermoelectric responses is a signature of many topological semimetals. The emergence of these photocurrents is inherently linked to symmetry breaking and anisotropy of…

Contrast transfer mechanisms for electron scattering have been extensively studied in transmission electron microscopy. Here we revisit H. Rose's generalized contrast formalism from scattering theory to understand where information is…

光学 · 物理学 2025-10-28 Desheng Ma , Guanxing Li , David A Muller , Steven E Zeltmann

Focused ion beams (FIBs) are widely used in nanofabrication for applications such as circuit repair, ultra-thin lamella preparation, strain engineering, and quantum device prototyping. Although the lateral spread of the ion beam is often…

仪器与探测器 · 物理学 2025-11-04 M. G. Masteghin , Z. P. Aslam , A. P. Brown , M. J. Whiting , S. K. Clowes , R. P. Webb , D. C. Cox

Ptychography provides highly efficient imaging in scanning transmission electron microscopy (STEM), but questions have remained over its applicability to strongly scattering samples such as those most commonly seen in materialsscience.…

应用物理 · 物理学 2022-09-07 C. Gao , C. Hofer , D. Jannis , A. Béché , J. Verbeeck , T. J. Pennycook

Fresnel theory is used to derive the complex electric-fields above and below an X-ray reflecting interface that separates two materials with differing indices of refraction. The interference between the incident and reflected waves produces…

材料科学 · 物理学 2009-08-17 Michael J. Bedzyk

Spectroscopic techniques that are sensitive to molecular chirality are important analytical tools to quantitatively determine enantiomeric excess and purity of chiral molecular samples. Many chiroptical processes however produce weak…

化学物理 · 物理学 2026-04-02 Sebastian Hartweg , Dusan k. Bozanic , Gustavo A. Garcia-Macias , Laurent Nahon

Dual phase xenon detectors are widely used in experimental searches for galactic darkmatter particles. The origin of single electron backgrounds following prompt scintillation and proportional scintillation signals in these detectors is not…

Three different evaluations of the energy dependence of the transmission-detection function of a two-stage cylindrical electron analyzer have been obtained by resorting to three established procedures. Their relative merits have been tested…

仪器与探测器 · 物理学 2010-01-19 Pierre Bracconi , Olivier Heintz

We have fabricated multilayer readout wiring Transition Edge Sensors (TES), which enable us to realize both large effective area and high-energy resolution for future X-ray astrophysical missions, such as DIOS. By sandwiching a SiO2…

仪器与探测器 · 物理学 2014-02-04 Shin'ya Yamada , Y. Ezoe , Y. Ishisaki , T. Ohashi , N. Iijima , K. Mitsuda , K. Nagayoshi , H. Akamatsu , T. Morooka , K. Tanaka