相关论文: Scanning electron diffraction tomography of strain

Dielectric tensor tomography reconstructs the three-dimensional dielectric tensors of microscopic objects and provides information about the crystalline structure orientations and principal refractive indices. Because dielectric tensor…

Electron tomographic reconstruction is a method for obtaining a three-dimensional image of a specimen with a series of two dimensional microscope images taken from different viewing angles. Filtered backprojection, one of the most popular…

Addressing the need for efficient and integrated multiscale crystallographic and defect analyses of advanced materials, this paper presents the implementation of a new multi-configuration detection system, integrating a single…

Photoelasticity enables full-field stress analysis in transparent objects through stress-induced birefringence. Existing techniques are limited to 2D slices and require destructively slicing the object. Recovering the internal 3D stress…

The recent development of electron sensitive and pixelated detectors has attracted the use of four-dimensional scanning transmission electron microscopy (4D-STEM). Here, we present a precession electron diffraction assisted 4D-STEM…

Electrochemical strains are a ubiquitous feature of solid state ionic devices ranging from ion batteries and fuel cells to electroresistive and memristive memories. Recently, we proposed a scanning probe microscopy (SPM) based approach,…

An inverse scattering problem for SAR data in application to through-the-wall imaging is addressed. In contrast with the conventional algorithms of SAR imaging, that work with the linearized mathematical model based on the Born…

Diffraction tomography is an inverse scattering technique used to reconstruct the spatial distribution of the material properties of a weakly scattering object. The object is exposed to radiation, typically light or ultrasound, and the…

Many man-made objects are characterised by a shape that is symmetric along one or more planar directions. Estimating the location and orientation of such symmetry planes can aid many tasks such as estimating the overall orientation of an…

Many printed electronic applications require strain-independent electrical properties to ensure deformation-independent performance. Thus, developing printed, flexible devices using 2D and other nanomaterials will require an understanding…

This paper treats the inverse problem of retrieving the electrical conductivity of a material starting from boundary measurements in the framework of Electrical Resistance Tomography (ERT). In particular, the focus is on non-iterative…

On the quest towards full control over wave propagation, the development of compact devices that allow asymmetric response is a challenge. In this Letter, we introduce a new paradigm for the engineering of asymmetry in planar structures,…

Being able to see beyond the direct line of sight is an intriguing prospective and could benefit a wide variety of important applications. Recent work has demonstrated that time-resolved measurements of indirect diffuse light contain…

Lattice defects play a key role in determining the properties of crystalline materials. Probing the 3D lattice strains that govern their interactions remains a challenge. Bragg Coherent Diffraction Imaging (BCDI) allows strain to be…

Electron tomography is a widely used experimental technique for analyzing nanometer-scale structures of a large variety of materials in three dimensions. Unfortunately, the acquisition of conventional electron tomography tilt series can…

In this paper we deal with the important problem of estimating the local strain tensor from a sequence of micro-structural images realized during deformation tests of engineering materials. Since the strain tensor is defined via the…

Structural distortions in nano-materials can induce dramatic changes in their electronic properties. This situation is well manifested in graphene, a two-dimensional honeycomb structure of carbon atoms with only one atomic layer thickness.…

Compact direct electron detectors are becoming increasingly popular in electron microscopy applications including electron backscatter diffraction, as they offer an opportunity for low cost and accessible microstructural analysis. In this…

An approach for the crystallographic mapping of two-phase alloys on the nanoscale using a combination of scanned precession electron diffraction and open-source python libraries is introduced in this paper. This method is demonstrated using…

Four-dimensional scanning transmission electron microscopy (4D-STEM) is one of the most rapidly growing modes of electron microscopy imaging. The advent of fast pixelated cameras and the associated data infrastructure have greatly…