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Transmission electron microscopy (TEM) is carried out in vacuum to minimize the interaction of the imaging electrons with gas molecules while passing through the microscope column. Nevertheless, in typical devices, the pressure remains at…

介观与纳米尺度物理 · 物理学 2019-01-25 Gregor T. Leuthner , Stefan Hummel , Clemens Mangler , Timothy J. Pennycook , Toma Susi , Jannik C. Meyer , Jani Kotakoski

Transmission electron microscopy (TEM) has reached ~ 50 picometer resolution in a high vacuum, enabling single-atom sensitive imaging of nanomaterials. Extending this capability to gaseous environments would allow for similar visualizations…

The desire to image specimens in liquids has led to the development of open-cell and closed-cell techniques in transmission electron microscopy (TEM). The closed-cell approach is currently more common in TEM and has yielded new insights…

应用物理 · 物理学 2023-08-22 Barnaby D. A. Levin , Diane Haiber , Qianlang Liu , Peter A. Crozier

Atomic resolution imaging in transmission electron microscopy (TEM) and scanning TEM (STEM) of light elements in electron-transparent materials has long been a challenge. Biomolecular materials, for example, are rapidly altered when…

An environmental cell high resolution electron microscope (EHREM) has been developed for in situ studies of dynamic chemical reactions on the atomic scale. It allows access to metastable intermediate phases of catalysts and to sequences of…

化学物理 · 物理学 2017-05-17 Edward Boyes , Pratibha Gai

CVD grown graphene used in (scanning) transmission electron microscopy ((S)TEM) studies must undergo a careful transfer of the one-atom-thick membrane from the growth surface (typically a Cu foil) to the TEM grid. During this transfer…

材料科学 · 物理学 2018-08-06 Ondrej Dyck , Songkil Kim , Sergei V. Kalinin , Stephen Jesse

By stacking various two-dimensional (2D) atomic crystals [1] on top of each other, it is possible to create multilayer heterostructures and devices with designed electronic properties [2-5]. However, various adsorbates become trapped…

介观与纳米尺度物理 · 物理学 2012-09-06 S. J. Haigh , A. Gholinia , R. Jalil , S. Romani , L. Britnell , D. C. Elias , K. S. Novoselov , L. A. Ponomarenko , A. K. Geim , R. Gorbachev

Environmental transmission electron microscopy (E-TEM) enables direct observation of nanoscale chemical processes crucial for catalysis and materials design. However, the high-energy electron probe can dramatically alter reaction pathways…

The scanning electron microscope (SEM) delivers high resolution, high depth of focus and an image quality as if microscopic objects are seen by the naked eye. This makes it not only a powerful scientific instrument, but a tool inherently…

应用物理 · 物理学 2025-04-01 Casimir Kuzyk , Alexander Dimitrakopoulos , Alireza Nojeh

Correlating structure with electronic functionality is central to the engineering of quantum materials and devices whose properties depend sensitively on disorder. Transmission electron microscopy (TEM) offers high spatial resolution…

Electron tomography (ET) has been demonstrated to be a powerful tool in addressing challenging problems, such as understanding 3D interactions among various microstructures. Advancing ET to broader applications requires novel…

应用物理 · 物理学 2020-01-22 Yizhi Zhang , Yeqiang Bu , Xiaoyang Fang , Hongtao Wang

Thin film oxides are a source of endless fascination for the materials scientist. These materials are highly flexible, can be integrated into almost limitless combinations, and exhibit many useful functionalities for device applications.…

材料科学 · 物理学 2025-06-17 Steven R. Spurgeon

The reduced dimensionality in two-dimensional materials leads a wealth of unusual properties, which are currently explored for both fundamental and applied sciences. In order to study the crystal structure, edge states, the formation of…

介观与纳米尺度物理 · 物理学 2021-01-04 Felix Kern , Martin Linck , Daniel Wolf , Nasim Alem , Himani Arora , Sibylle Gemming , Artur Erbe , Alex Zettl , Bernd Büchner , Axel Lubk

In-situ transmission electron microscopy (TEM) has become an important technique to study dynamic processes at highest spatial resolution and one branch is the investigation of phenomena related with electrical currents. Here, we present…

介观与纳米尺度物理 · 物理学 2025-11-13 Simon Hettler , Raul Arenal

Observing the individual building blocks of matter is one of the primary goals of microscopy. The invention of the scanning tunneling microscope [1] revolutionized experimental surface science in that atomic-scale features on a solid-state…

材料科学 · 物理学 2008-08-04 Jannik C. Meyer , C. O. Girit , M. F. Crommie , A. Zettl

The controlled creation and manipulation of defects in 2D materials has become increasingly popular as a means to design and tune new material functionalities. However, defect characterization by direct atomic imaging is often severely…

材料科学 · 物理学 2023-12-06 Dana O. Byrne , Jim Ciston , Frances I. Allen

Transmission electron microscopes (TEMs) enable atomic-scale imaging and characterisation, driving advances across fields from materials science to biology. Quantum correlations, specifically entanglement, may provide a basis for novel…

Superconducting quantum circuits are one of the leading quantum computing platforms. To advance superconducting quantum computing to a point of practical importance, it is critical to identify and address material imperfections that lead to…

介观与纳米尺度物理 · 物理学 2021-11-03 Xiao Guo , Xin He , Zach Degnan , Bogdan C. Donose , Karl Bertling , Arkady Fedorov , Aleksandar D. Rakić , Peter Jacobson

Scanning electron microscopy (SEM) of nanoscale objects in their native conditions and at different temperatures are of critical importance in revealing details of their interactions with ambient environments. Currently available…

材料科学 · 物理学 2023-07-19 Ahmed S. Al-Asadi , Jie Zhang , Jianbo Li , Radislav A. Potyrailo , Andrei Kolmakov

The implementation of a monolithic fiber-optically coupled CMOS-based TemCam-XF416 camera into our ultra-high vacuum (UHV) ultrafast reflection high-energy electron diffraction setup is reported. A combination of a pumpable gate valve and a…

介观与纳米尺度物理 · 物理学 2024-11-20 Jonas D. Fortmann , Alexander Kaßen , Christian Brand , Thomas Duden , Michael Horn-von Hoegen
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