相关论文: Determining the refractive index, absolute thickne…
White light spectral interferometry is applied to measure the refractive index in absorbing liquids in the spectral range from 400 to 1000 nm. We analyze the influence of absorption on the visibility of interferometric fringes and,…
The detection of spatial or temporal variations in very thin samples has important applications in the biological sciences. For example, cellular membranes exhibit changes in lipid composition and order, which in turn modulate their…
We present a robust, precise, and accurate method to simultaneously measure the refractive indices of two transparent materials within an interference coating. This is achieved by measuring both a photometrically accurate transmittance…
Precise measurements of the geometrical thickness of a sample and its refractive index are important for materials science, engineering, and medical diagnosis. Among the possible non-contact evaluation methods, optical interferometric…
Spectroscopic ellipsometry is a powerful method with high surface sensitivity that can be used to monitor the growth of even sub-monolayer film. However, the analysis of ultrathin films is complicated by the correlation of the dielectric…
A simple method was developed to observe the interference patterns of the light reflected by the interfaces of thin liquid films. Employing a fluorescent microscope with epi-illumination, we collected the 2D patterns of interference fringes…
A new approach was proposed to accurately determine the thickness of film, especially for ultra-thin film, through spectrum fitting with the assistance of interference layer. The determination limit can reach even less than 1 nm. Its…
With the development of terahertz time-domain spectroscopy, methods have been proposed to precisely estimate the thickness, refractive index, and attenuation coefficient of a sample. In this article, we propose a new method to compute these…
A novel method is proposed to measure the refractive indices (RIs) of the materials of different transparent solid state media. To exploit the advantage of non-contact measurement laser beam interferometry is used as an effective technique…
Diffraction of light beams from the phase steps due to the abrupt changes in the boundary of step leads to Fresnel fringes that their visibility and intensity profile depend on the change of the step height or light incident angle. The…
Refractive index is a fundamental optical property of powder and a key input to the measurement of the size distribution using light scattering and the measurement of the absorption and scattering coefficients using diffuse reflectance…
In this study we present an interferometric technique based on multiple wavelengths to capture the transient free surface contour of nanoliter drops spreading on a wettable surface, in particular close to the three-phase contact line.…
We demonstrate applications of a novel scheme which is used for measuring refractive index and thickness of thin film by analyzing the relative phase difference and reflected ratio at reflection point of a monolithic folded Fabry-Perot…
Determination of refractive index of micro-disks of a calcinated ($1100^\circ$C in air) photo-resist SZ2080$^\mathrm{TM}$ was carried out using transmission and reflection spectroscopy. Interference fringes at specific…
Two methods of refractometry in reflected light from optical surface of samples are considered and studied experimentally. Methods are grounded on results of Fresnel theory of concerning light reflectivity at near normal incidence and…
Uncertainties of refractive and group index in dispersion measurement by spectrally resolved white light interferometry are deeply analyzed. First, the contribution to uncertainty of the different parameters affecting both indices is…
An interferometer has been used to measure the surface profile of generic object. Frequency scanning interferometry has been employed to provide unambiguous phase readings, to suppress etalon fringes, and to supersede phase-shifting. The…
This paper describes the spherical concave mirror method for measuring the index of refraction of transparent liquids. We derived the refractive index equation using Snell's law and the small-angle approximation. We also verified the…
Dynamic thin film interferometry is a technique used to non-invasively characterize the thickness of thin liquid films. Recovering the underlying thickness from the captured interferograms, unconditionally and automatically is still an open…
We present a new imaging technique, swept-angle synthetic wavelength interferometry, for full-field micron-scale 3D sensing. As in conventional synthetic wavelength interferometry, our technique uses light consisting of two…