相关论文: Probes for Ultrasensitive THz Nanoscopy

A recent study shows that: when a long lifetime particle is positioned near a plasmonic metal nanoparticle, lifetime of plasmon oscillations extends, but, "only" near that long-life particle [PRB 101, 035416 (2020)]. Here, we show that this…

We analyse how a probing particle modifies infrared electromagnetic near fields. The particle, assimilated to both electric and magnetic dipoles, represents the tip of an apertureless scanning optical near-field microscope (SNOM). We show…

We describe a first principles method to calculate scanning tunneling microscopy (STM) images, and compare the results to well-characterized experiments combining STM with atomic force microscopy (AFM). The theory is based on density…

A digital signal acquisition system for an Apertureless SNOM (ASNOM) based on a digital signal processing (DSP) card is presented. An electromagnetic wave scattered by an AFM-like tip is initially detected by an optical homodyning in a…

Scattering-type scanning near-field optical microscopy (s-SNOM) is a powerful tool for investigating polaritonic modes. However, an inherent limitation of this technique is that excitation and detection occur at the same location. This…

By using scattering in near field techniques, a microscope can be easily turned into a device measuring static and dynamic light scattering, very useful for the characterization of nanoparticle dispersions. Up to now, microscopy based…

The rapid development of nanoscience and nanotechnology in the last two decades was stimulated by the emergence of scanning probe microscopy (SPM) techniques capable of accessing local material properties, including transport, mechanical,…

Recently, computational sampling methods have been implemented to spatially characterize terahertz (THz) fields. Previous methods usually rely on either specialized THz devices such as THz spatial light modulators, or complicated systems…

A thorough understanding of biological species and of emerging nanomaterials requires, among others, their in-depth characterization with optical techniques capable of nano-resolution. Nanoscopy techniques based on tip-enhanced optical…

This article reviews the new developments in Tip-enhanced Raman scattering (TERS). The fundamental mechanisms underlying the Raman enhancement are discussed, including the role of the plasmonic character of the metallic tips, the nature of…

Atomic Force Microscopy (AFM) allows to reconstruct the topography of surface with a resolution in the nanometer range. The exceptional resolution attainable with the AFM makes this instrument a key tool in nanoscience and technology. The…

The atomic force microscope (AFM) is a versatile, high-resolution tool used to characterize the topography and material properties of a large variety of specimens at nano-scale. The interaction of the micro-cantilever tip with the specimen…

The ability to generate, detect, and control coherent terahertz (THz) spin currents with femtosecond temporal and nanoscale spatial resolution has significant ramifications. The diffraction limit of concentrated THz radiation, which has a…

Terahertz (THz) wave shows great potential in non-destructive testing, bio detection and cancer imaging. Recent progresses on THz wave near-field probes/apertures enable mechanically raster scanning of an object's surface in the near-field…

Scanning near-field field optical microscopy (SNOM) is a technique, which allows sub-wavelength optical imaging of photonic structures. While the electric field components of light can be routinely obtained, imaging of the magnetic…

Probing the local transport properties of two-dimensional electron systems (2DES) confined at buried interfaces requires a non-invasive technique with a high spatial resolution operating in a broad temperature range. In this paper, we…

In recent years several methods to overcome diffraction limit in the far field microscopy have been demonstrated. Still the problem of superresolution is reliably solved only for fluorescent microscopy, giving a resolution of up to 20-30nm.…

Sum-frequency generation (SFG) is a powerful second-order nonlinear spectroscopic technique that provides detailed insights into molecular structures and absolute orientations at surfaces and interfaces. However, conventional SFG based on…

Apertureless scanning near-field optical microscopy (a-SNOM) is typically limited to ~10 nm resolution by the tip apex size. We demonstrate that ~1-nm resolution can be achieved under continuous-wave (CW) illumination by exploiting Fano…

AFM is a technique widely applied in the nanoscale characterisation of polymers and their surface properties. With nano-FTIR and IR-sSNOM imaging an optical dimension is added to this technique that allows for straightforward high…