中文
相关论文

相关论文: Probes for Ultrasensitive THz Nanoscopy

200 篇论文

The ability to perform nanometer-scale optical imaging and spectroscopy is key to deciphering the low-energy effects in quantum materials, as well as vibrational fingerprints in planetary and extraterrestrial particles, catalytic…

Time-resolved scanning near-field optical microscopy (tr-SNOM) enables the measurement of the dynamic optical response of functional surfaces beyond the diffraction limit. Experimental challenges are imposed both by the use of a pulsed…

光学 · 物理学 2026-04-16 Philipp Schwendke , Julia Stähler , Samuel Palato

In this paper we consider the application of electromagnetic theory to the analysis of the Scanning Near-field Optical Microscope (SNOM) in order to predict experimentally observable quantities such as the transmission or reflection…

凝聚态物理 · 物理学 2015-06-25 A. J. Ward , J. B. Pendry

A nanoscopy technique that can characterize light-matter interactions with ever increasing spatial resolution and signal-to-noise ratio (SNR) is desired for spectroscopy at molecular levels. Photoinduced force microscopy (PiFM) with…

应用物理 · 物理学 2018-10-17 Mohsen Rajaei , Mohammad Ali Almajhadi , Jinwei Zeng , H. Kumar Wickramasinghe

We introduce a scattering-type scanning near-field infrared microscope (s-SNIM) for the local scale near- field sample analysis and spectroscopy from room (RT) down to liquid helium (LHe) temperatures. The extension of s-SNIM down to T = 5K…

仪器与探测器 · 物理学 2018-03-02 D. Lang , J. Döring , T. Nörenberg , A. Butykai , I. Kézsmárki , H. Schneider , S. Winnerl , M. Helm , S. C. Kehr , L. M. Eng

Validating material performance in electrical devices is crucial to product development. For Gallium Nitride (GaN) devices, evaluating material factors such as defects, dopant concentration, and overall production quality is essential to…

Terahertz scanning near-field optical microscope (THz-SNOM) is employed to measure ultrafast evolution of THz conductivity spectra after photoexcitation of GaAs and InP wafers using ultrashort laser pulses. Unlike in GaAs, the THz…

介观与纳米尺度物理 · 物理学 2025-01-22 Tinkara Troha , Arvind Singh , Petr Kužel , Hynek Němec

We investigate the radiation patterns of sharp conical gold tapers, designed as adiabatic nanofocusing probes for scanning near-field optical microscopy (SNOM). Field calculations show that only the lowest order eigenmode of such a taper…

Structured metallic tips are increasingly important for optical spectroscopies such as tip-enhanced Raman spectroscopy (TERS), with plasmonic resonances frequently cited as a mechanism for electric field enhancement. We probe the local…

Sub-nm resolution images can be achieved by Atomic Force Microscopy (AFM) on samples that are deposited on hard substrates. However, it is still extremely challenging to image soft interfaces, such as biological membranes, due to the…

Multi-tip scanning tunneling microscopy (STM) is a powerful method to perform charge transport measurements at the nanoscale. With four STM tips positioned on the surface of a sample, four-point resistance measurements can be performed in…

介观与纳米尺度物理 · 物理学 2022-01-28 A. Leis , V. Cherepanov , B. Voigtländer , F. S. Tautz

We have studied the formation of near-field fringes when sharp edges of materials are imaged using scattering-type scanning near-field optical microscope (s-SNOM). Materials we have investigated include dielectrics, metals, near-perfect…

Studying nanoscale dynamics is essential for understanding quantum materials and advancing quantum chip manufacturing. Still, it remains a major challenge to measure non-equilibrium properties such as current and dissipation, and their…

Scattering-type scanning near-field optical microscopy (s-SNOM) is a powerful technique for extreme subwavelength imaging and spectroscopy, with around 20 nm spatial resolution. But quantitative relationships between experiment and material…

We analyze how a probing particle modifies the infrared electromagnetic near field of a sample. The particle, described by electric and magnetic polarizabilities, represents the tip of an apertureless scanning optical near-field microscope…

Atomic force microscopy (AFM) has been constantly supporting nanosciences and nanotechnologies for over 30 years, being present in many fields from condensed matter physics to biology. It enables measuring very weak forces at the nanoscale,…

仪器与探测器 · 物理学 2021-09-07 L Schwab , P Allain , N Mauran , X Dollat , L Mazenq , D Lagrange , M Gély , S Hentz , G Jourdan , I Favero , B Legrand

Scanning probe microscopy (SPM) is traditionally based on very sharp tips, where the small size of the apex is critical for resolution. This paradigm is about to shift, since a novel generation of planar probes (color centers in diamond,…

仪器与探测器 · 物理学 2021-06-24 Stefan Ernst , Dominik M. Irber , Andreas M. Waeber , Georg Braunbeck , Friedemann Reinhard

Lightwave-driven terahertz scanning tunnelling microscopy (THz-STM) is capable of exploring ultrafast dynamics across a wide range of materials with angstrom resolution. In contrast to scanning near-field optical microscopy, where photons…

介观与纳米尺度物理 · 物理学 2024-11-14 Vedran Jelic , Stefanie Adams , Mohamed Hassan , Kaedon Cleland-Host , S. Eve Ammerman , Tyler L. Cocker

Terahertz scanning tunneling microscopy (THz-STM) has emerged as a potent technique for probing ultrafast nanoscale dynamics with exceptional spatiotemporal precision, whereby the acquisition of THz near-field waveforms holds paramount…

光学 · 物理学 2024-03-21 Hongbo Li , Tianwu Wang , Wenyin Wei , Kai Zhang , Jing-yin Xu , Yirong Wu , Guangyou Fang

THz-spectroscopy is an attractive imaging tool for scientific research, especially in life science, offering non-destructive interaction with matter due to its low photon energies. However, wavelengths above $100{\mu}m$ principally limit…