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It has been shown that electron transitions, as measured in a scanning tunnelling microscope (STM), are related to chemical interactions in a tunnelling barrier. Here, we show that the shape and apparent height of subatomic features in an…

材料科学 · 物理学 2009-11-11 Linda Zotti , Werner A. Hofer , Franz J. Giessibl

Since the invention of the atomic force microscope (AFM) in 1986, there has been a drive to apply this scanning probe technique or a form of this technique to various disciplines in nanoscale science. Magnetic force microscopy (MFM) is a…

仪器与探测器 · 物理学 2017-04-28 Gustavo Cordova , Brenda Yasie Lee , Zoya Leonenko

Terahertz Time Domain Spectroscopy (THz-TDS) systems have emerged as mature technologies with significant potential across various research fields and industries. However, the lack of standardized methods for signal and noise estimation and…

Using electrostatic coupling between an AFM tip and a metallic surface as a test interaction, we here present the measurement of the force between the tip and the surface, together with the measurement of the interaction stiffness and the…

介观与纳米尺度物理 · 物理学 2014-12-09 Simon Carpentier , Mario S. Rodrigues , Joël Chevrier

The in situ combination of Scanning Probe Microscopies (SPM) with X-ray microbeams adds a variety of new possibilities to the panoply of synchrotron radiation techniques. In this paper we describe an optics-free AFM/STM that can be directly…

材料科学 · 物理学 2009-01-09 Mario Rodrigues , Olivier Dhez , Simon Le Denmat , Joel Chevrier , Roberto Felici , Fabio Comin

Optical nanofibers (ONF) of subwavelength dimensions confine light in modes with a strong evanescent field that can trap, probe, and manipulate nearby quantum systems. To measure the evanescent field and propagating modes, and to optimize…

Tip-enhanced Raman spectroscopy (TERS) typically relies on high-NA excitation to generate a strong axial field at the tip apex, which shortens the working distance and constrains sample geometries. We show that a plasmonic bi-cavity tip,…

Electron paramagnetic resonance (EPR) performed with a scanning tunneling microscope (STM) allows for probing the spin excitation of single atomic species with MHz energy resolution. One of the basic applications of conventional EPR is the…

介观与纳米尺度物理 · 物理学 2021-11-10 Tom S. Seifert , Stepan Kovarik , Pietro Gambardella , Sebastian Stepanow

Atomic force microscopy is based on tip sample interaction, which is determined by the properties of tip and sample. Unfortunately, in particular in ambient conditions the tip as well as the sample are contaminated, and it is not clear how…

介观与纳米尺度物理 · 物理学 2017-12-19 J. Sánchez , L. Almonte , J. Colchero

Microscopy such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM) and Scanning Electron Microscopy (SEM) are essential tools in material imaging at micro- and nanoscale resolutions to extract physical knowledge and…

We present experimental demonstration of tilt-mirror assisted transmission structured illumination microscopy (tSIM) that offers a large field of view super resolution imaging. An assembly of custom-designed tilt-mirrors are employed as the…

Subwavelength metallic resonators provide a route to achieving strong light-matter coupling by means of tight confinement of resonant electromagnetic fields. Investigation of such resonators however often presents experimental difficulties,…

We propose a scanning magnetic microscope which has a photoluminescence nanoprobe implanted in the tip of an AFM or STM, or NSOM, and exhibits optically detected magnetic resonance (ODMR). The proposed spin microscope has nanoscale lateral…

量子物理 · 物理学 2009-11-10 Boris M. Chernobrod , Gennady P. Berman

A nanometer-sized superconducting quantum interference device (nanoSQUID) is fabricated on the apex of a sharp quartz tip and integrated into a scanning SQUID microscope. A simple self-aligned fabrication method results in nanoSQUIDs with…

AFM-based technique of nanolithography is proposed. The method enables rapid point by point indentation with a sharp tip. When used in tandem with single-crystal diamond tips, this technique allows the creation of high aspect ratio grooves…

介观与纳米尺度物理 · 物理学 2013-12-04 Alexei Temiryazev

Atomic force microscope (AFM) generally works on the basis of manipulating absolute magnitude of van der Waals (vdW) force between the tip and specimen. The force is, however, less sensitive to alternation of atom species than to tip-sample…

光学 · 物理学 2023-10-20 Han Yu-Xiao , Bai Benfeng , Zhang Jian-Yu , Huang Jia-Tai , Feng Peng-Yi , Sun Hong-Bo

We present a near-field optical technique for second harmonic imaging using bare tapered optical fiber tip illuminated with femtosecond laser pulses. Enhancement of electric field at the tip of the fiber results in enhanced second harmonic…

材料科学 · 物理学 2009-10-31 I. I. Smolyaninov , H. Y. Liang , S. Aggarwal , R. Ramesh , C. H. Lee , C. C. Davis

Quantifying the tip-sample interaction at the nanoscale in Amplitude Modulation mode AFM is challenging, especially when measuring in liquids. Here, we derive formulas for the tip-sample conservative and dissipative interactions and…

仪器与探测器 · 物理学 2015-11-24 Luca Costa , Mario S Rodrigues

Measuring the field of visible light with high spatial resolution has been challenging, as many established methods only detect a focus-averaged signal. Here, we introduce a near-field method for optical field sampling that overcomes that…

The SuperNova/Acceleration Probe (SNAP) mission will require a two-meter class telescope delivering diffraction limited images spanning a one degree field in the visible and near infrared wavelength regime. This requirement, equivalent to…

天体物理学 · 物理学 2007-05-23 M. Lampton , SNAP Collaboration
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