相关论文: A Range Matching CAM for Hierarchical Defect Toler…

IR-based fault localization approaches achieves promising results when locating faulty files by comparing a bug report with source code. Unfortunately, they become less effective to locate faulty methods. We conduct a preliminary study to…

This paper presents a machine learning-based approach to correct inference errors caused by stuck-at faults in fully analog ReRAM-based neuromorphic circuits. Using a Design-Technology Co-Optimization (DTCO) simulation framework, we model…

This work presents a novel approach to improve phase identification in nanomechanical property maps of multiphase materials, such as those obtained by nanoindentation or atomic force microscopy (AFM). A major challenge in validating…

SRAM-based cache memory faces several scalability limitations in deep nanoscale technologies, e.g., high leakage current, low cell stability, and low density. Emerging Non-Volatile Memory (NVM) technologies have received lots of attention…

In this paper, we study the inference accuracy of the Resistive Random Access Memory (ReRAM) neuromorphic circuit due to stuck-at faults (stuck-on, stuck-off, and stuck at a certain resistive value). A simulation framework using Python is…

Controlling crystalline material defects is crucial, as they affect properties of the material that may be detrimental or beneficial for the final performance of a device. Defect analysis on the sub-nanometer scale is enabled by…

Quantum Random Access Memory (QRAM) holds the promise of enabling several large scale applications of quantum computers. However, designing fault tolerant QRAMs for large scale applications is still an open problem due to the poor error and…

Recent research demonstrated the promise of using resistive random access memory (ReRAM) as an emerging technology to perform inherently parallel analog domain in-situ matrix-vector multiplication -- the intensive and key computation in…

We report on ultrasonic imaging in a random heterogeneous medium. The goal is to detect flaws embedded deeply into a polycrystalline material. A 64-element array of piezoelectric transmitters/receivers at a central frequency of 5 MHz is…

Resistive random-access memory (RRAM) is widely recognized as a promising emerging hardware platform for deep neural networks (DNNs). Yet, due to manufacturing limitations, current RRAM devices are highly susceptible to hardware defects,…

Triple Modular Redundancy (TMR) is a suitable fault tolerant technique for SRAM-based FPGA. However, one of the main challenges in achieving 100% robustness in designs protected by TMR running on programmable platforms is to prevent upsets…

This paper summarizes our work on experimentally characterizing, mitigating, and recovering data retention errors in multi-level cell (MLC) NAND flash memory, which was published in HPCA 2015, and examines the work's significance and future…

The problem of missing data has been persistent for a long time and poses a major obstacle in machine learning and statistical data analysis. Past works in this field have tried using various data imputation techniques to fill in the…

With the shrinking of technology nodes and the use of parallel processor clusters in hostile and critical environments, such as space, run-time faults caused by radiation are a serious cross-cutting concern, also impacting architectural…

Despite the impressive search rate of one key per clock cycle, the update stage of a random-access-memory-based content-addressable-memory (RAM-based CAM) always suffers high latency. Two primary causes of such latency include: (1) the…

Recent advances in the industrial inspection of textured surfaces-in the form of visual inspection-have made such inspections possible for efficient, flexible manufacturing systems. We propose an unsupervised feature memory rearrangement…

Networks often exhibit structure at disparate scales. We propose a method for identifying community structure at different scales based on multiresolution modularity and consensus clustering. Our contribution consists of two parts. First,…

Convolutional Neural Networks (CNNs) have become integral in safety-critical applications, thus raising concerns about their fault tolerance. Conventional hardware-dependent fault tolerance methods, such as Triple Modular Redundancy (TMR),…

Machine Learning (ML) is making a strong resurgence in tune with the massive generation of unstructured data which in turn requires massive computational resources. Due to the inherently compute- and power-intensive structure of Neural…

Reducing the threshold voltage of electronic devices increases their sensitivity to electromagnetic radiation dramatically, increasing the probability of changing the memory cells' content. Designers mitigate failures using techniques such…