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Terahertz time-domain conductivity measurements in 2 to 100 nm thick iron films resolve the femtosecond time delay between applied electric fields and resulting currents. This current response time decreases from 29 fs for thickest films to…

材料科学 · 物理学 2020-08-19 K. L. Krewer , W. Zhang , J. Arabski , G. Schmerber , E. Beaurepaire , M. Bonn , D. Turchinovich

Shrinking CMOS interconnect dimensions to the nanometer scale intensifies electron scattering at surfaces, interfaces, and grain boundaries, causing severe conductivity loss and challenging copper-based designs. Here we present a…

材料科学 · 物理学 2025-08-13 YoungJun Lee , Jin Soo Lee , Seungjun Lee , Seoung-Hun Kang , Young-Kyun Kwon

We present field effect measurements on discontinuous 2D thin films which are composed of a sub monolayer of nano-grains of Au, Ni, Ag or Al. Like other electron glasses these systems exhibit slow conductance relaxation and memory effects.…

强关联电子 · 物理学 2015-06-04 Tal Havdala , Ariel Eizenbach , Aviad Frydman

Transient reflectivity measurements of thin films, ranging from 6 to 40 nm in thickness, of the topological insulator Bi2Se3 revealed a strong dependence of the carrier relaxation time on the film thickness. For thicker films the relaxation…

介观与纳米尺度物理 · 物理学 2015-06-17 Yuri D. Glinka , Sercan Babakiray , Trent A. Johnson , Mikel B. Holcomb , David Lederman

Electron transport is studied in surface oxidized single-crystal copper thin films with a thickness of up to 5.6 nm by applying density functional theory and density functional tight binding methods to determine electron transport…

Magnetic relaxation and critical current density have been measured on a $MgB_2$ thin film in a wide region of temperature with the magnetic field up to 8 T. The irreversibility line has also been determined. It is found that the relaxation…

超导电性 · 物理学 2009-11-07 H. H. Wen , S. L. Li , Z. W. Zhao , H. Jin , Y. M. Ni , W. N. Kang , H. J. Kim , E. M. Choi , S. I. Lee

The dielectric properties of thin films are of paramount important in a variety of technological applications, and of fundamental importance for solid state research. In spite of this, there is currently no theoretical understanding of the…

材料科学 · 物理学 2024-04-02 Alessio Zaccone

The performance of low temperature detectors utilizing thermal effects is determined by their energy relaxation properties. Usually, heat transport experiments in mesoscopic structures are carried out in the steady-state, where temperature…

介观与纳米尺度物理 · 物理学 2020-08-11 L. B. Wang , D. S. Golubev , Y. M. Galperin , J. P. Pekola

The magnetic dynamics of low-dimensional iron ion chains have been studied with regards to the tunable finite-sized chain length using iron phthalocyanine thin films. The deposition temperature varies the diffusion length during thin film…

材料科学 · 物理学 2017-02-01 Paul D. Ekstrand , Daniel J. Javier , Thomas Gredig

Spin relaxation in the ultrathin metallic films of stacked microelectronic devices is investigated on the basis of a modified Landau-Lifshitz equation of micromagnetic dynamics in which the damping torque is treated as originating from the…

材料科学 · 物理学 2012-10-22 Sergey Bastrukov , Jun Yong Khoo , Boris Lukiyanchuk , Irina Molodtsova

The analysis of quantum corrections to magnetoconductivity of thin Au films responsible for by the effect of weak electron localization has made it possible to determine the temperature dependences of electron phase relaxation time in the…

无序系统与神经网络 · 物理学 2009-10-31 B. I. Belevtsev , Yu. F. Komnik , E. Yu. Beliayev

It is shown that the conductance relaxations observed in electrical field effect measurements on granular Al films are the sum of two contributions. One is sensitive to gate voltage changes and gives the already reported anomalous…

无序系统与神经网络 · 物理学 2011-06-17 Julien Delahaye , Jean Honoré , Thierry Grenet

The miniaturization of electronic devices has led to the prominence, in technological applications, of semiconductor thin films that are only a few nanometers thick. In spite of intense research, the thickness-dependent resistivity or…

介观与纳米尺度物理 · 物理学 2025-04-15 Alessio Zaccone

We propose a model for the description of the transport properties of metallic films on a large scale of slab thickness. This model is based on solving the linearized Boltzmann equation in relaxation-time approximation using {\it ab initio}…

材料科学 · 物理学 2007-05-23 Dmitry V. Fedorov Peter Zahn Ingrid Mertig

We propose a model for predicting the fluctuations of electron states in thin films as function of film thickness. The model was derived based on the assumption of the existence of potential barrier fluctuations on the film surface. Since…

介观与纳米尺度物理 · 物理学 2016-01-19 Mikrajuddin Abdullah

The near threshold "soft breakdown" measurements of PVC films conductivity are investigated. In a wide range of external electric field strength for various rather thick (>20 mkm) PVC films the resistance shows strong nonlinearity and seems…

材料科学 · 物理学 2010-04-29 D. V. Vlasov , L. A. Apresyan , V. I. Krystob , T. V. Vlasova

Theory of linear microwave response of thin films of type-II superconductors in the mixed state is developed taking into account random spatial fluctuations of the parameters of the system, such as the order parameter, diffusion…

超导电性 · 物理学 2023-05-03 B. V. Pashinsky , M. V. Feigel'man , A. V. Andreev

We use optical pump--THz probe spectroscopy at low temperatures to study the hot carrier response in thin Bi$_2$Se$_3$ films of several thicknesses, allowing us to separate the bulk from the surface transient response. We find that for…

介观与纳米尺度物理 · 物理学 2015-06-23 R. Valdés Aguilar , J. Qi , M. Brahlek , N. Bansal , A. Azad , J. Bowlan , S. Oh , A. J. Taylor , R. P. Prasankumar , D. A. Yarotski

When the thickness of the layer is smaller than the electrons mean free path, the morphology affects the conductivity directly based on the layer thickness. This issue provides basis in order to estimate the thickness of the layer by…

介观与纳米尺度物理 · 物理学 2015-06-16 M. Jannesar , G. R. Jafari , S. Vasheghani Farahani , S. Moradi

The effect of thickness on the width of the percolation threshold in metal-dielectric composite films was examined. The distribution of current intensities through cubic networks of metal and dielectric components was determined using…

统计力学 · 物理学 2017-02-13 M. Mokhtari , L. Zekri , A. Kaiss , N. Zekri
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