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Measuring the total electron emission yield of dielectric materials remains a challenging task. Indeed, the charge induced by irradiation and electron emission disturbs the measurement. It is therefore important to quantify this charge…

Devices made from two dimensional materials such as graphene and transition metal dichalcogenides exhibit remarkable electronic properties of interest to many subdisciplines of nanoscience. Owing to their 2D nature, their quality is highly…

介观与纳米尺度物理 · 物理学 2019-11-12 Michael A. Altvater , Shuang Wu , Zhenyuan Zhang , Tianhui Zhu , Guohong Li , Kenji Watanabe , Takashi Taniguchi , Eva Y. Andrei

High-quality spatially-resolved measurements of electric fields are critical to understanding charge injection, charge transport, and charge trapping in semiconducting materials. Here, we report a variation of frequency-modulated Kelvin…

介观与纳米尺度物理 · 物理学 2017-10-30 Ryan P. Dwyer , Louisa M. Smieska , Ali Moeed Tirmzi , John A. Marohn

The onset of transformation optics has opened avenues for designing of a plenitude of applications related to propagation of electromagnetic waves in anisotropic media. In this paper, an algorithm is proposed using a coordinate…

光学 · 物理学 2015-11-30 H. H. Sidhwa , R. P. Aiyar , S. V. Kulkarni

Surface cracks are a very common indicator of potential structural faults. Their early detection and monitoring is an important factor in structural health monitoring. Left untreated, they can grow in size over time and require expensive…

计算机视觉与模式识别 · 计算机科学 2022-02-09 Jacob König , Mark Jenkins , Mike Mannion , Peter Barrie , Gordon Morison

We propose a novel probe technique capable of performing local low-temperature spectroscopy on a 2D electron system (2DES) in a semiconductor heterostructure. Motivated by predicted spatially-structured electron phases, the probe uses a…

介观与纳米尺度物理 · 物理学 2011-01-06 Adam Sciambi , Matthew Pelliccione , Seth R. Bank , Arthur C. Gossard , David Goldhaber-Gordon

In this study, we consider a topological derivative-based imaging technique for the fast identification of short, linear perfectly conducting cracks completely embedded in a two-dimensional homogeneous domain with smooth boundary. Unlike…

数值分析 · 数学 2026-03-24 Won-Kwang Park

Electrical impedance tomography is an imaging modality for extracting information on the interior structure of a physical body from boundary measurements of current and voltage. This work studies a new robust way of modeling the contact…

数值分析 · 数学 2022-07-06 J. Dardé , N. Hyvönen , T. Kuutela , T. Valkonen

We determine the conductivity of the interior of a body using electrical measurements on its surface. We assume only that the conductivity is bounded below by a positive constant and that the conductivity and surface are Lipschitz…

偏微分方程分析 · 数学 2025-07-30 Pedro Caro , María Ángeles García-Ferrero , Keith M. Rogers

The inverse problem of electrical impedance tomography is severely ill-posed. In particular, the resolution of images produced by impedance tomography deteriorates as the distance from the measurement boundary increases. Such depth…

偏微分方程分析 · 数学 2020-04-21 Henrik Garde , Nuutti Hyvönen

Atomically thin films and surfaces exhibit many distinctive two-dimensional electronic properties that are absent in bulk crystals. In situ microscale multi-probe measurements have been utilized as an effective method to identify the…

应用物理 · 物理学 2025-03-27 Tomoyuki Iori , Ryu Yukawa

Electronic conduction pathways in dielectric thin films are explored using automated experiments in scanning probe microscopy (SPM). Here, we use large field of view scanning to identify the position of localized conductive spots and…

The accurate modeling of electromagnetic penetration is an important topic in computational electromagnetics. Electromagnetic penetration occurs through intentional or inadvertent openings in an otherwise closed electromagnetic scatterer,…

Fractures are ubiquitous in the subsurface. The flow and mechanical properties of these fractures are controlled by its compliance or stiffness. Characterizing fracture compliance and conductivity is crucial in applications such as fault…

地球物理 · 物理学 2019-05-13 HanYi Wang , Mukul M. Sharma

Carpet cloaking is proposed to hide an object on a dielectric half-space from electromagnetic (EM) detection. A two-dimensional conformal transformation specified by an analytic function is utilized for the design. Only one nonsingular…

光学 · 物理学 2014-03-31 Pu Zhang , Michaël Lobet , Sailing He

This work builds on the previous introduction [1] of a coupled experimental-computational system devised to fully characterize the thermal behavior of complex 3D submicron electronic devices. The new system replaces the laser-based surface…

材料科学 · 物理学 2007-09-13 Peter E. Raad , Pavel L. Komarov , M. Burzo

The electrocaloric effect refers to the temperature change in a material when an electric field is applied or removed. Significant breakthroughs revealed its potential for solid-state cooling technologies in past decades. These devices…

介观与纳米尺度物理 · 物理学 2025-04-10 Jean Spièce , Valentin Fonck , Charalambos Evangeli , Phil S. Dobson , Jonathan M. R. Weaver , Pascal Gehring

Devices made from two-dimensional (2D) materials such as graphene or transition metal dichalcogenides possess interesting electronic properties that can become accessible to experimental probes when the samples are protected from…

介观与纳米尺度物理 · 物理学 2019-07-16 Michael A. Altvater , Tianhui Zhu , Guohong Li , Kenji Watanabe , Takashi Taniguchi , Eva Y. Andrei

Scanning Kelvin probe microscopy (SKPM) is a powerful technique for macroscopic imaging of the electrostatic potential above a surface. Though most often used to image work-function variations of conductive surfaces, it can also be used to…

应用物理 · 物理学 2025-06-10 Isaac C. D. Lenton , Felix Pertl , Lubuna Shafeek , Scott R. Waitukaitis

The purpose of this project is to investigate the use of charge couple devices (CCDs) to detect electrons directly. This can be done in transmission electron microscopy (TEM) for electrons over 100 KeV, but for space plasma instruments,…

仪器与探测器 · 物理学 2015-10-28 S. R. Mirfayzi
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