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We analyze electrostatic interaction between a sharp conducting tip and a thin one-dimensional wire, e.g., a carbon nanotube, in a scanned gate microscopy (SGM) experiment. The problem is analytically tractable if the wire resides on a thin…

介观与纳米尺度物理 · 物理学 2010-04-02 Lingfeng M. Zhang , Michael M. Fogler

We propose an analytical formulation for the Scanning Gate Microscopy (SGM) response to local tips with arbitrary strength in two terminal nano-structures. The real space resolved conductance is expressed in terms of the unperturbed…

介观与纳米尺度物理 · 物理学 2023-09-14 Ousmane Ly

We use a cooled Scanning Probe Microscope (SPM) to electron motion in nanoscale devices. The charged tip of the SPM is raster scanned at a constant height above the surface as the conductance of the device is measured. The image charge…

介观与纳米尺度物理 · 物理学 2017-03-08 Sagar Bhandari , Gil-Ho Lee , Philip Kim , Robert M. Westervelt

Research in semiconductor physics has advanced to the study of two-dimensional (2D) materials where the surface controls electronic transport. A scanning probe microscope (SPM) is an ideal tool to image electronic motion in these devices by…

介观与纳米尺度物理 · 物理学 2017-02-01 Sagar Bhandari , Robert M. Westervelt

We analyze electron paths in a solid-state double-slit interferometer based on the two-dimensional electron gas and their mapping by the scanning gate microscopy (SGM). A device with a quantum point source contact of a split exit and a…

介观与纳米尺度物理 · 物理学 2015-08-25 K. Kolasiński , B. Szafran

A cooled scanning probe microscope (SPM) has been used to image cyclotron orbits of electrons through high-mobility graphene in a magnetic field.1-5 In a hBN-graphene-hBN device patterned into a hall bar geometry, the magnetic field focuses…

介观与纳米尺度物理 · 物理学 2016-11-16 Sagar Bhandari , Andrew Lin , Robert M. Westervelt

We study scanning gate microscopy (SGM) conductance mapping of a $\mathrm{MoS}_2$ zigzag ribbon exploiting tight-binding and continuum models. We show that, even though the edge modes of a pristine nanoribbon are robust to backscattering on…

介观与纳米尺度物理 · 物理学 2020-05-18 M. Prokop , D. Gut , M. P. Nowak

We present a quantum model which provides enhanced understanding of recent transverse magnetic focusing experiments on graphene $p$-$n$ junctions. Spatially resolved flow maps of local particle current density show quantum interference and…

介观与纳米尺度物理 · 物理学 2017-04-26 Samuel W LaGasse , Ji Ung Lee

We show that scanning gate microscopy can be used for probing electron-electron interactions inside a nanostructure. We assume a simple model made of two non-interacting strips attached to an interacting nanosystem. In one of the strips,…

介观与纳米尺度物理 · 物理学 2008-10-07 Axel Freyn , Ioannis Kleftogiannis , Jean-Louis Pichard

We have performed scanning gate microscopy (SGM) on graphene field effect transistors (GFET), using a biased metallic nanowire coated with a dielectric layer as a contact mode tip and local top gate. Electrical transport through graphene at…

The Landauer-B\"uttiker formalism establishes an equivalence between the electrical conduction through a device, e.g., a quantum dot, and the transmission. Guided by this analogy we perform transmission measurements through three-port…

We theoretically propose to directly observe the chiral nature of charge carriers in graphene mono- and bilayers within a controlled scattering experiment. The charge located on a capacitively coupled scanning probe microscope (SPM) tip…

介观与纳米尺度物理 · 物理学 2009-11-13 Matthias Braun , Luca Chirolli , Guido Burkard

We consider conductance mapping of systems based on the two-dimensional electron gas with scanning gate microscopy using two and more tips of the atomic force microscope. The paper contains results of numerical simulations for a model tip…

介观与纳米尺度物理 · 物理学 2015-05-28 K. Kolasiński , B. Szafran , B. Hackens

An open resonator fabricated in a two-dimensional electron gas is used to explore the transition from strongly invasive scanning gate microscopy to the perturbative regime of weak tip-induced potentials. With the help of numerical…

介观与纳米尺度物理 · 物理学 2018-08-28 R. Steinacher , C. Pöltl , T. Krähenmann , A. Hofmann , C. Reichl , W. Zwerger , W. Wegscheider , R. A. Jalabert , K. Ensslin , D. Weinmann , T. Ihn

Electron flow through a quantum point contact in presence of spin-orbit coupling is investigated theoretically in the context of the scanning gate microscopy (SGM) conductance mapping. Although in the absence of the floating gate the…

介观与纳米尺度物理 · 物理学 2014-07-09 M. P. Nowak , K. Kolasiński , B. Szafran

The metallic tip of a scanning force microscope operated at 300 mK is used to locally induce a potential in a fully controllable double quantum dot defined via local anodic oxidation in a GaAs/AlGaAs heterostructure. Using scanning gate…

介观与纳米尺度物理 · 物理学 2011-06-20 Magdalena Huefner , Bruno Kueng , Stephan Schnez , Klaus Ensslin , Thomas Ihn , Matthias Reinwald , Werner Wegscheider

We use scanning gate microscopy to map out the trajectories of ballistic carriers in high-mobility graphene encapsulated by hexagonal boron nitride and subject to a weak magnetic field. We employ a magnetic focusing geometry to image…

Graphene provides a fascinating testbed for new physics and exciting opportunities for future applications based on quantum phenomena. To understand the coherent flow of electrons through a graphene device, we employ a nanoscale probe that…

介观与纳米尺度物理 · 物理学 2010-01-29 J. Berezovsky , M. F. Borunda , E. J. Heller , R. M. Westervelt

Electronic transport in semiconducting single-wall carbon nanotubes is studied by combined scanning gate microscopy and scanning impedance microscopy (SIM). Depending on the probe potential, SIM can be performed in both invasive and…

介观与纳米尺度物理 · 物理学 2009-11-07 Sergei V. Kalinin , Dawn A. Bonnell , Marcus Freitag , A. T. Johnson

The conductance of graphene nanoribbons and nanoconstrictions under the effect of a scanning gate microscopy tip is systematically studied. Using a scattering approach for noninvasive probes, the first- and second-order conductance…

介观与纳米尺度物理 · 物理学 2023-02-20 Xianzhang Chen , Guillaume Weick , Dietmar Weinmann , Rodolfo A. Jalabert
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