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Electrostatic forces are among the most common interactions in nature and omnipresent at the nanoscale. Scanning probe methods represent a formidable approach to study these interactions locally. The lateral resolution of such images is,…

介观与纳米尺度物理 · 物理学 2023-12-22 Christian Wagner , F. Stefan Tautz

This paper presents a brief review of scanning-gate microscopy applied to the imaging of electron transport in buried semiconductor quantum structures. After an introduction to the technique and to some of its practical issues, we summarise…

We present a scanning probe microscopy technique for spatially resolving transport in cold atomic gases, in close analogy with scanning gate microscopy in semiconductor physics. The conductance of a quantum point contact connected to two…

We report combined scanning probe microscopy and electrical measurements to investigate local electronic transport in reduced graphene oxide (rGO) devices. We demonstrate that quantum transport in these materials can be significantly tuned…

介观与纳米尺度物理 · 物理学 2025-09-17 Julian Sutaria , Cristian Staii

We theoretically study scanning gate microscopy (SGM) of electron and hole trajectories in a quantum point contact (QPC) embedded in a normal-superconductor (NS) junction. At zero voltage bias, the electrons and holes transported through…

介观与纳米尺度物理 · 物理学 2024-03-13 S. Maji , K. Sowa , M. P. Nowak

We show evidence of the backscattering of quantum Hall edge channels in a narrow graphene Hall bar, induced by the gating effect of the conducting tip of a Scanning Gate Microscope, which we can position with nanometer precision. We show…

介观与纳米尺度物理 · 物理学 2017-11-17 Lennart Bours , Stefano Guiducci , Alina Mreńca-Kolasińska , Bartłomiej Szafran , Jan C Maan , Stefan Heun

We perform scanning-gate microscopy on a quantum-point contact. It is defined in a high-mobility two-dimensional electron gas of an AlGaAs/GaAs heterostructure, giving rise to a weak disorder potential. The lever arm of the scanning tip is…

介观与纳米尺度物理 · 物理学 2012-02-21 S. Schnez , C. Rössler , T. Ihn , K. Ensslin , C. Reichl , W. Wegscheider

Recent experiments reveal that a scanning tunneling microscopy (STM) probe tip can generate a highly localized strain field in a graphene drumhead, which in turn leads to pseudomagnetic fields in the graphene that can spatially confine…

We use impedance spectroscopy to measure the high frequency properties of single-walled carbon nanotube field effect transistors (swCN-FETs). Furthermore, we extend Scanning Gate Microscopy (SGM) to frequencies up to 15MHz, and use it to…

材料科学 · 物理学 2007-05-23 Cristian Staii , Rui Shao , Dawn A. Bonnell , Alan T. Johnson

A systematic theory of the conductance measurements of non-invasive (weak probe) scanning gate microscopy is presented that provides an interpretation of what precisely is being measured. A scattering approach is used to derive explicit…

介观与纳米尺度物理 · 物理学 2013-07-12 C. Gorini , R. A. Jalabert , W. Szewc , S. Tomsovic , D. Weinmann

We investigate the conductance properties of a hybrid ferromagnet-semiconductor structure consisting of a confined two-dimensional electron gas and a transverse ferromagnetic strip on top. Within the framework of the Landauer-B\"uttiker…

介观与纳米尺度物理 · 物理学 2009-10-31 Michele Governale , Daniel Boese

Simulations of scanning tunneling microscopy measurements for molecules on surfaces are traditionally based on a perturbative approach, most typically employing the Tersoff-Hamann method. This assumes that the STM tip is far from the sample…

介观与纳米尺度物理 · 物理学 2015-05-13 C. Toher , S. Sanvito

We use low-temperature scanning gate microscopy (SGM) to investigate the breakdown of the quantum Hall regime in an exfoliated bilayer graphene flake. SGM images captured during breakdown exhibit intricate patterns of "hotspots" where the…

介观与纳米尺度物理 · 物理学 2013-03-05 M. R. Connolly , R. K. Puddy , D. Logoteta , P. Marconcini , M. Roy , J. Griffths , G. A. C. Jones , P. Maksym , M. Macucci , C. G. Smith

We demonstrate a scanning gate grid measurement technique consisting in measuring the conductance of a quantum point contact (QPC) as a function of gate voltage at each tip position. Unlike conventional scanning gate experiments, it allows…

介观与纳米尺度物理 · 物理学 2016-03-01 A. A. Kozikov , R. Steinacher , C. Rössler , T. Ihn , K. Ensslin , C. Reichl , W. Wegscheider

We investigate the effect of a scanning gate tip in the nonlinear quantum transport properties of nanostructures. Generally, we predict that the symmetry of the current-voltage characteristic in reflection-symmetric samples is broken by a…

介观与纳米尺度物理 · 物理学 2014-03-18 Cosimo Gorini , Dietmar Weinmann , Rodolfo A. Jalabert

Multi-tip scanning tunneling microscopy (STM) is a powerful method to perform charge transport measurements at the nanoscale. With four STM tips positioned on the surface of a sample, four-point resistance measurements can be performed in…

介观与纳米尺度物理 · 物理学 2022-01-28 A. Leis , V. Cherepanov , B. Voigtländer , F. S. Tautz

This paper presents an overview of scanning-gate microscopy applied to the imaging of electron transport through buried semiconductor nanostructures. After a brief description of the technique and of its possible artifacts, we give a…

介观与纳米尺度物理 · 物理学 2011-04-13 F. Martins , B. Hackens , H. Sellier , P. Liu , M. G. Pala , S. Baltazar , L. Desplanque , X. Wallart , V. Bayot , S. Huant

This article reports on tunable electron backscattering investigated with the biased tip of a scanning force microscope. Using a channel defined by a pair of Schottky gates, the branched electron flow of ballistic electrons injected from a…

介观与纳米尺度物理 · 物理学 2016-02-11 R. Steinacher , A. A. Kozikov , C. Rössler , C. Reichl , W. Wegscheider , K. Ensslin , T. Ihn

We report numerical simulation result of a recently proposed \{P. Bruno, Phys. Rev. Lett {\bf 79}, 4593, (1997)\} approach to perform magnetic scanning tunneling microscopy with a two terminal non-magnetic tip. It is based upon the spin…

介观与纳米尺度物理 · 物理学 2009-10-31 T. P. Pareek , Patrick Bruno

We describe a new type of scanning probe microscope based on a superconducting quantum interference device (SQUID) that resides on the apex of a sharp tip. The SQUID-on-tip is glued to a quartz tuning fork which allows scanning at a…